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UCC27511DBVT Datasheet(PDF) 5 Page - Texas Instruments

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Part # UCC27511DBVT
Description  Single Channel High-Speed, Low-Side Gate Driver
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

UCC27511DBVT Datasheet(HTML) 5 Page - Texas Instruments

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UCC27511
UCC27512
www.ti.com
SLUSAW9C – FEBRUARY 2012 – REVISED JUNE 2012
RECOMMENDED OPERATING CONDITIONS
over operating free-air temperature range (unless otherwise noted)
MIN
TYP
MAX
UNIT
Supply voltage range, VDD
4.5
12
18
V
Operating junction temperature range
-40
140
°C
Input voltage, IN+ and IN-
0
18
V
THERMAL INFORMATION
UCC27511
UCC27512
THERMAL METRIC
SOT-23 (DBV)
(1)WSON
UNITS
6 PINS
6 PINS
θJA
Junction-to-ambient thermal resistance(2)
217.8
85.6
θJCtop
Junction-to-case (top) thermal resistance(3)
97.6
100.1
θJB
Junction-to-board thermal resistance(4)
72.2
58.6
°C/W
ψJT
Junction-to-top characterization parameter(5)
8.6
7.5
ψJB
Junction-to-board characterization parameter(6)
71.6
58.7
θJCbot
Junction-to-case (bottom) thermal resistance(7)
n/a
23.7
(1)
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
(2)
The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
(3)
The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-
standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(4)
The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
(5)
The junction-to-top characterization parameter,
ψJT, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining
θJA, using a procedure described in JESD51-2a (sections 6 and 7).
(6)
The junction-to-board characterization parameter,
ψJB, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining
θJA , using a procedure described in JESD51-2a (sections 6 and 7).
(7)
The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific
JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
NOTE
Under identical power dissipation conditions, the DRS package will allow to maintain a
lower die temperature than the DBV.
θJA metric should be used for comparison of power
dissipation
capability
between
different
packages
(Refer
to
the
APPLICATION
INFORMATION Section).
Copyright © 2012, Texas Instruments Incorporated
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Product Folder Link(s): UCC27511 UCC27512


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