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SN65LVDS84AQDGGRQ1 Datasheet(PDF) 8 Page - Texas Instruments |
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SN65LVDS84AQDGGRQ1 Datasheet(HTML) 8 Page - Texas Instruments |
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8 / 15 page  CLKIN D0, 6, 12 D1, 7, 13 D2, 8, 14 D3, 9, 15 D18, 19, 20 All others tc CLKIN Even Dn Odd Dn SN65LVDS84AQ-Q1 SLLS766A – AUGUST 2006 – REVISED APRIL 2008........................................................................................................................................................ www.ti.com PARAMETER MEASUREMENT INFORMATION (continued) A. The 16-grayscale test-pattern test device power consumption for a typical display pattern. B. VIH = 2 V and VIL = 0.8 V Figure 4. 16-Grayscale Test-Pattern Waveforms A. The worst-case test pattern produces nearly the maximum switching frequency for all of the LVDS outputs. B. VIH = 2 V and VIL = 0.8 V Figure 5. Worst-Case Test-Pattern Waveforms 8 Submit Documentation Feedback Copyright © 2006–2008, Texas Instruments Incorporated Product Folder Link(s): SN65LVDS84AQ-Q1 |
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