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SN65HVD3088EDRG4 Datasheet(PDF) 3 Page - Texas Instruments |
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SN65HVD3088EDRG4 Datasheet(HTML) 3 Page - Texas Instruments |
3 / 26 page SN65HVD3082E, SN75HVD3082E SN65HVD3085E, SH65HVD3088E www.ti.com SLLS562G – AUGUST 2009 – REVISED MAY 2009 RECOMMENDED OPERATING CONDITIONS (1) over operating free-air temperature range unless otherwise noted MIN NOM MAX UNIT Supply voltage, VCC 4.5 5.5 V Voltage at any bus terminal (separately or common mode) , VI –7 12 High-level input voltage (D, DE, or RE inputs), VIH 2 VCC V Low-level input voltage (D, DE, or RE inputs), VIL 0 0.8 V Differential input voltage, VID –12 12 V Driver –60 60 Output current, IO mA Receiver –8 8 Differential load resistance, RL 54 60 Ω SN65HVD3082E, SN75HVD3082E 0.2 Signaling rate, 1/tUI SN65HVD3085E 1 Mbps SN65HVD3088E 20 SN65HVD3082E, SN65HVD3085E, SN65HVD3088E –40 85 Operating free–air temperature, TA °C SN75HVD3082E 0 70 Junction temperature, TJ (2) –40 130 °C (1) The algebraic convention, in which the least positive (most negative) limit is designated as minimum is used in this data sheet. (2) See thermal characteristics table for information on maintenance of this specification for the DGK package. SUPPLY CURRENT over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP(1) MAX UNIT D at VCC or open, DE at VCC, Driver and receiver enabled 425 900 µA RE at 0 V, No load D at VCC or open, DE at VCC, Driver enabled, receiver disabled 330 600 µA RE at VCC, No load ICC D at VCC or open, DE at 0 V, Receiver enabled, driver disabled 300 600 µA RE at 0 V, No load D at VCC or open, DE at 0 V, Driver and receiver disabled 0.001 2 µA RE at VCC (1) All typical values are at 25°C and with a 5–V supply. ELECTROSTATIC DISCHARGE PROTECTION PARAMETER TEST CONDITIONS MIN TYP(1) MAX UNIT Human body model Bus terminals and GND ±15 kV Human body model(2) All pins ±4 kV Charged-device-model(3) All pins ±1 kV Electrical Fast Transient/Burst(4) A, B, and GND ±4 kV (1) All typical values at 25°C. (2) Tested in accordance with JEDEC Standard 22, Test Method A114–A and IEC 60749–26. (3) Tested in accordance with JEDEC Standard 22, Test Method C101. (4) Tested in accordance with IEC 61000–4–4. Copyright © 2009, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Link(s): SN65HVD3082E SN75HVD3082E SN65HVD3085E SH65HVD3088E |
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