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FEATURES

3

2

4

5

1

A

Y

B

GND

DCK PACKAGE

(TOP VIEW)

See mechanical drawings for dimensions.

DESCRIPTION/ORDERING INFORMATION

SN74LVC1G86-EP

SINGLE 2-INPUT EXCLUSIVE-OR GATE

SCES679 – JULY 2007

• Controlled Baseline

• Latch-Up Performance Exceeds 100 mA Per

JESD 78, Class II

–

One Assembly/Test Site, One Fabrication

Site

• ESD Protection Exceeds JESD 22

• Extended Temperature Performance of -55°C

–

2000-V Human-Body Model (A114-A)

to 125

°C

–

200-V Machine Model (A115-A)

• Enhanced Diminishing Manufacturing Sources

–

1000-V Charged-Device Model (C101)

(DMS) Support

• Enhanced Product-Change Notification

• Supports 5-V V

• Inputs Accept Voltages to 5.5 V

• Max t

• Low Power Consumption, 15-μA Max I

CC

• ±24-mA Output Drive at 3.3 V

• I

Operation

(1)

Component qualification in accordance with JEDEC and

industry standards to ensure reliable operation over specified

temperature range. This includes, but is not limited to, Highly

Accelerated Stress Test (HAST) or biased 85/85, temperature

cycle, autoclave or unbiased HAST, electromigration, bond

intermetallic life, and mold compound life. Such qualification

testing should not be viewed as justifying use of this

component beyond specified performance and environmental

limits.

The SN74LVC1G86 performs the Boolean function Y = A

⊕ B or Y = AB + AB in positive logic.

A common application is as a true/complement element. If the input is low, the other input is reproduced in true

form at the output. If the input is high, the signal on the other input is reproduced inverted at the output.

preventing damaging current backflow through the device when it is powered down.

ORDERABLE PART NUMBER

–55

°C to 125°C

SOT (SC-70) – DCK

Reel of 3000

SN74LVC1G86MDCKREP

CJ_

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

website at www.ti.com.

(2)

Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.

(3)

DCK: The actual top-side marking has one additional character that designates the assembly/test site.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2007, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.