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TPS74901KTWRG3 Datasheet(PDF) 2 Page - Texas Instruments |
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TPS74901KTWRG3 Datasheet(HTML) 2 Page - Texas Instruments |
2 / 27 page TPS749xx SBVS082G – JUNE 2007 – REVISED NOVEMBER 2010 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION(1) PRODUCT VOUT (2) TPS749xx yyy z XX is nominal output voltage (for example, 12 = 1.2V, 15 = 1.5V, 01 = Adjustable).(3) YYY is package designator. Z is package quantity. (1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. (2) Fixed output voltages from 0.8V to 3.3V are available; minimum order quantities may apply. Contact factory for details and availability. (3) For fixed 0.8V operation, tie FB to OUT. ABSOLUTE MAXIMUM RATINGS (1) At TJ = –40°C to +125°C, unless otherwise noted. All voltages are with respect to GND. PARAMETER TPS749xx UNIT VIN, VBIAS Input voltage range –0.3 to +6 V VEN Enable voltage range –0.3 to +6 V VPG Power-good voltage range –0.3 to +6 V IPG PG sink current 0 to +1.5 mA VSS SS pin voltage range –0.3 to +6 V VFB Feedback pin voltage range –0.3 to +6 V VOUT Output voltage range –0.3 to VIN + 0.3 V IOUT Maximum output current Internally limited Output short-circuit duration Indefinite PDISS Continuous total power dissipation See Thermal Information Table TJ Operating junction temperature range –40 to +125 °C TSTG Storage junction temperature range –55 to +150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2 Submit Documentation Feedback Copyright © 2007–2010, Texas Instruments Incorporated |
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