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SN74LVC2G17-EP Datasheet(PDF) 2 Page - Texas Instruments |
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SN74LVC2G17-EP Datasheet(HTML) 2 Page - Texas Instruments |
2 / 12 page www.ti.com 1A 1Y 1 6 2A 2Y 3 4 Absolute Maximum Ratings (1) Recommended Operating Conditions (1) (2) SN74LVC2G17-EP DUAL SCHMITT-TRIGGER BUFFER SCES683 – JANUARY 2007 LOGIC DIAGRAM (POSITIVE LOGIC) over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT VCC Supply voltage range –0.5 6.5 V VI Input voltage range(2) –0.5 6.5 V VO Voltage range applied to any output in the high-impedance or power-off state(2) –0.5 6.5 V VO Voltage range applied to any output in the high or low state(2)(3) –0.5 VCC + 0.5 V IIK Input clamp current VI < 0 –50 mA IOK Output clamp current VO < 0 –50 mA IO Continuous output current ±50 mA Continuous current through VCC or GND ±100 mA DBV package 165 θ JA Package thermal impedance(4) °C/W DCK package 259 Tstg Storage temperature range –65 150 °C (1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed. (3) The value of VCC is provided in the recommended operating conditions table. (4) The package thermal impedance is calculated in accordance with JESD 51-7. MIN MAX UNIT VCC Supply voltage Operating 1.65 5.5 V VI Input voltage 0 5.5 V VO Output voltage 0 VCC V VCC = 1.65 V –4 VCC = 2.3 V –8 IOH High-level output current –16 mA VCC = 3 V –24 VCC = 4.5 V –32 VCC = 1.65 V 4 VCC = 2.3 V 8 IOL Low-level output current 16 mA VCC = 3 V 24 VCC = 4.5 V 32 TA Operating free-air temperature –55 125 °C (1) All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report, Implications of Slow or Floating CMOS Inputs, literature number SCBA004. (2) Long-term high-temperature storage and/or extended use at maximum recommended operating conditions may result in a reduction of overall device life. See http://www.ti.com/ep_quality for additional information on enhanced plastic packaging. 2 Submit Documentation Feedback |
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