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HVDA5405QDRQ1 Datasheet(PDF) 8 Page - Texas Instruments |
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HVDA5405QDRQ1 Datasheet(HTML) 8 Page - Texas Instruments |
8 / 27 page SN65HVDA540-Q1, SN65HVDA541-Q1, SN65HVDA542-Q1 SN65HVDA540-5-Q1, SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 SLLS804B – MARCH 2009 – REVISED SEPTEMBER 2010 www.ti.com ABSOLUTE MAXIMUM RATINGS (1) (2) 1.1 VCC Supply voltage range –0.3 V to 6 V 1.2 VIO I/O supply voltage range –0.3 V to 6 V Voltage range at bus terminals (CANH, 1.3 –27 V to 40 V CANL) 1.4 IO Receiver output current (RXD) 20 mA SN65HVDA54x –0.3 V to 6 V and VI ≤ VIO + 0.3 V 1.5 VI Voltage input range (TXD, STB, S) SN65HVDA54x-5 –0.3 V to 6 V Operating virtual-junction temperature 1.6 TJ –40°C to 150°C range Lead temperature (soldering, 10 1.7 TLEAD 260°C seconds) (1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltage values, except differential I/O bus voltages, are with respect to ground terminal. ELECTROSTATIC DISCHARGE AND TRANSIENT PROTECTION (1) PARAMETER TEST CONDITIONS VALUE 2.1 CANH and CANL(3) ±12 kV Human-Body Model(2) 2.2 All pins ±4 kV 2.3 Charged-Device Model(4) All pins ±1 kV Electrostatic Discharge 2.4 Machine Model(5) ±200 V IEC 61000-4-2 according to IBEE CAN ±7 kV 2.5 CANH and CANL pins to GND EMC Test Specification(6) 2.6 Pulse 1 -100 V 2.7 Pulse 2a +75 V ISO7637 transients according to IBEE ISO 7637 Transients CAN EMC Test Specification(7) 2.8 Pulse 3a -150 V 2.9 Pulse 3b +100 V (1) Stresses beyond those listed under "electrostatic discharge and transient protection" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) HBM Tested in accordance with AEC-Q100-002. (3) HBM test method based on AEC-Q100-002, CANH and CANL bus pins stressed with respect to each other and GND. (4) CDM Tested in accordance with AEC-Q100-011. (5) MM Tested in accordance with AEC-Q100-003. (6) IEC 61000-4-2 is a system level ESD test. Results given here are specific to the IBEE CAN EMC Test specification conditions. Different system level configurations will lead to different results. (7) ISO 7637 is a system level transient test. Results given here are specific to the IBEE CAN EMC Test specification conditions. Different system level configurations will lead to different results. RECOMMENDED OPERATING CONDITIONS MIN MAX UNIT 3.1 VCC Supply voltage 4.68 5.33 V 3.2 VIO I/O supply voltage 3 5.33 V 3.3 VI or VIC Voltage at any bus terminal (separately or common mode) –12 12 V 3.4 VIH High-level input voltage TXD, STB, S(for SN65HVD54x-5: VIO = VCC) 0.7 × VIO VIO V 3.5 VIL Low-level input voltage TXD, STB, S (for SN65HVD54x-5: VIO = VCC) 0 0.3 × VIO V 3.6 VID Differential input voltage, bus Between CANH and CANL –6 6 V 3.7 IOH High-level output current RXD –2 mA 3.8 IOL Low-level output current RXD 2 mA Operating ambient free-air 3.9 TA See Thermal Characteristics table -40 125 °C temperature 8 Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 |
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