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SN65HVD11SHKJ Datasheet(PDF) 8 Page - Texas Instruments |
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SN65HVD11SHKJ Datasheet(HTML) 8 Page - Texas Instruments |
8 / 30 page SN65HVD11-HT SLLS934E – NOVEMBER 2008 – REVISED JUNE 2012 www.ti.com RECEIVER ELECTRICAL CHARACTERISTICS over recommended operating conditions (unless otherwise noted) TA = –55°C to 125°C TA = 175°C (1) TA = 210°C (2) PARAMETER TEST CONDITIONS UNIT MIN TYP MAX MIN TYP MAX MIN TYP MAX Positive-going VIT+ input threshold IO = –8 mA –0.01 –0.01 –0.01 V voltage Negative-going VIT– input threshold IO = 8 mA –0.2 –0.2 –0.2 V voltage Hysteresis Vhys voltage 35 41 41 mV (VIT+ –VIT–) Enable-input VIK II = –18 mA –1.5 –1.5 –1.5 V clamp voltage High-level VID = 200 mV, IOH = –8 mA, VOH 2.4 2.4 2.4 V output voltage See Figure 8 Low-level VID = –200 mV, IOL = 8 mA, VOL 0.4 0.4 0.4 V output voltage See Figure 8 High- impedance IOZ VO = 0 or VCC, RE = VCC –1 1 –1 1 –1 1 μA state output current VA or VB = 12 V 0.075 0.11 0.1 0.15 0.1 0.15 Other VA or VB = 12 V, VCC = 0 V 0.085 0.13 0.12 0.16 0.12 0.16 Bus input II input mA current VA or VB = –7 V –0.1 –0.05 –0.3 –0.15 –0.3 –0.15 at 0 V VA or VB = –7 V, VCC = 0 V –0.1 –0.05 –0.3 –0.15 –0.3 –0.15 High-level input IIH VIH = 2 V –30 0 –30 3 –30 3 μA current, RE Low-level input IIL VIL = 0.8 V –30 0 –30 0 –30 0 μA current, RE Differential VID = 0.4 sin (4E6πt) + 0.5 V, CID input 15 18 18 pF DE at 0 V capacitance RE = 0 V, Receiver enabled D and DE = 0 V, and driver 5 8 7.5 8.5 7.5 10 mA No load disabled RE = VCC, Receiver disabled D = VCC, ICC Supply current and driver 2.5 20 12.5 200 175 450 μA DE = 0 V, disabled (standby) No load RE = 0 V, Receiver enabled D and DE = VCC, 11 15.5 11.5 17.5 14 18 mA and driver enabled No load (1) Minimum and maximum parameters are characterized for operation at TA = 175°C but may not be production tested at that temperature. Production test limits with statistical guardbands are used to ensure high temperature performance. (2) Minimum and maximum parameters are characterized for operation at TA = 210°C but may not be production tested at that temperature. Production test limits with statistical guardbands are used to ensure high temperature performance. 8 Submit Documentation Feedback Copyright © 2008–2012, Texas Instruments Incorporated Product Folder Link(s): SN65HVD11-HT |
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