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SN55HVD251 Datasheet(PDF) 2 Page - Texas Instruments

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Part # SN55HVD251
Description  INDUSTRIAL CAN TRANSCEIVER
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

SN55HVD251 Datasheet(HTML) 2 Page - Texas Instruments

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SN55HVD251
SN65HVD251
SLLS545E – NOVEMBER 2002 – REVISED MARCH 2010
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ORDERING INFORMATION
PART NUMBER
PACKAGE
TEMPERATURE RANGE
MARKED AS
SN65HVD251D
8-pin Small Outline Integrated Circuit (SOIC)
-40°C to 125°C
VP251
SN65HVD251P
8-pin Dual Inline Package (DIP)
-40°C to 125°C
65HVD251
SN55HVD251DRJ
8-pin Small Outline No-Lead (SON)
-55°C to 125°C
SN55HVD251
ABSOLUTE MAXIMUM RATINGS
(1) (2)
Values
Supply voltage range, VCC
-0.3 V to 7 V
Voltage range at any bus terminal (CANH or CANL)
-36 V to 36 V
Transient voltage per ISO 7637, pulse 1, 2, 3a, 3b
CANH, CANL
±200 V
Input voltage range, VI (D, Rs, or R)
-0.3 V to VCC + 0.5
Receiver output current, IO
–10 mA to 10 mA
CANH, CANL and GND
14 kV
Human Body Model (3)
Electrostatic discharge
All pins
6 kV
Charged-Device Model (4)
All pins
1 kV
Electrical fast transient/burst
IEC 61000-4-4, Classification B
CANH, CANL
±3 kV
(see the Package
Continuous total power dissipation
Dissipation Ratings Table)
(1)
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
(3)
Tested in accordance with JEDEC Standard 22, Test Method A114-A.
(4)
Tested in accordance with JEDEC Standard 22, Test Method C101.
PACKAGE DISSIPATION RATINGS
CIRCUIT BOARD
TA = 25°C
DERATING FACTOR (1)
TA = 85°C POWER
TA = 125°C POWER
PACKAGE
MODEL
POWER RATING
ABOVE TA = 25°C
RATING
RATING
Low-K(2)
576 mW
4.8 mW/°C
288 mW
96 mW
SOIC (D)
High-K(3)
924 mW
7.7 mW/°C
462 mW
154 mW
Low-K(2)
888 mW
7.4 mW/°C
444 mW
148 mW
PDIP (P)
High-K(3)
1212 mW
10.1 mW/°C
606 mW
202 mW
Low-K(2)
403 mW
4.03 mW/°C
262 mW
100 mW
High-K
1081 mW
10.8 mW/°C
703 mW
270 mW
SON (DRJ)
(no Vias)(3)
High-K
2793 mW
27.9 mW/°C
1815 mW
698 mW
(with Vias)
(1)
This is the inverse of the junction-to-ambient thermal resistance when board-mounted and with no air flow.
(2)
In accordance with the Low-K thermal metric definitions of EIA/JESD51-3.
(3)
In accordance with the High-K thermal metric definitions of EIA/JESD51-7.
2
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Copyright © 2002–2010, Texas Instruments Incorporated
Product Folder Link(s): SN55HVD251 SN65HVD251


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