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OPA2333HD Datasheet(PDF) 5 Page - Texas Instruments |
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OPA2333HD Datasheet(HTML) 5 Page - Texas Instruments |
5 / 23 page OPA2333-HT www.ti.com SBOS483F – JULY 2009 – REVISED AUGUST 2012 Electrical Characteristics: VS = 1.8 V to 5.5 V Boldface limits apply over the specified temperature range, TA = –55°C to 210°C. At TA = 25°C, RL = 10 kΩ connected to VS/2, VCM = VS/2, and VOUT = VS/2 (unless otherwise noted). TA = –55°C to 125°C TA = 175°C (1) TA = 210°C (2) UNIT PARAMETER TEST CONDITIONS MIN TYP MAX MIN TYP MAX MIN TYP MAX OFFSET VOLTAGE Input offset VOS VS = 5 V 2 10 μV voltage over 22 26 26 μV temperature vs dVOS/dT 0.02 0.05 0.05 μV/°C temperature vs power PSRR VS = 1.8 V to 5.5 V 1 6 1.2 8 1.7 11 μV/V supply Long-term See (3) stability(3) Channel 0.1 μV/V separation, dc INPUT BIAS CURRENT Input bias current IB ±70 ±200 pA over ±150 ±1250 ±5300 pA Temperature Input offset ±1060 IOS ±140 ±400 ±700 pA current 0 NOISE Input voltage noise, 0.3 1.0 1.0 μVPP f = 0.01 Hz to 1 Hz Input voltage noise, 1.1 1.5 1.5 μVPP f = 0.1 Hz to 10 Hz Input current in 100 fA/ √Hz noise, f = 10 Hz INPUT VOLTAGE RANGE Common mode (V–) – (V+) (V–) – (V–) + (V–) – (V–) + VCM V voltage range 0.1 + 0.1 0.25 0.25 0.25 0.25 Common-Mode CMRR (V–) – 0.1 V < VCM < (V+) + 0.1 V 102 130 101 91 dB Rejection Ratio INPUT CAPACITANCE Differential 2 4.25 4.25 pF Common mode 4 12.25 12.25 pF OPEN-LOOP GAIN Open-loop (V–) + 100 mV < VO < (V+) – 100 mV, AOL 104 130 93 110 85 93 dB voltage gain RL = 10 kΩ FREQUENCY RESPONSE Gain-bandwidth GBW CL = 100 pF 350 350 350 kHz product Slew rate SR G = 1 0.16 0.25 0.25 V/ μs (1) Minimum and maximum parameters are characterized for operation at TA = 175°C, but may not be production tested at that temperature. Production test limits with statistical guardbands are used to ensure high temperature performance. (2) Minimum and maximum parameters are characterized for operation at TA = 210°C, but may not be production tested at that temperature. Production test limits with statistical guardbands are used to ensure high temperature performance. (3) 300-hour life test at 150°C demonstrated randomly distributed variation of approximately 1 μV. Copyright © 2009–2012, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: OPA2333-HT |
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