+

−

CATHODE

ANODE

REF

REF

ANODE

CATHODE

1

2

3

4

8

7

6

5

CATHODE

NC

NC

NC

REF

NC

ANODE

NC

JG PACKAGE

(TOP VIEW)

NC – No internal connection

TL1431-SP

www.ti.com

SLVSB44 – JULY 2012

CLASS V, PRECISION PROGRAMMABLE REFERENCE

Check for Samples: TL1431-SP

1

FEATURES

•

QMLV Qualified, SMD 5962-99620

•

0.4% Initial Voltage Tolerance

•

0.2-

Ω Typical Output Impedance

•

Fast Turnon…500 ns

•

Sink Current Capability…1 mA to 100 mA

•

Low Reference Current (REF)

•

DESCRIPTION/ORDERING INFORMATION

The TL1431 is a precision programmable reference with specified thermal stability over automotive, commercial,

and 36 V with two external resistors. This device has a typical output impedance of 0.2

Ω. Active output circuitry

provides a very sharp turnon characteristic, making the device an excellent replacement for Zener diodes and

other types of references in applications such as onboard regulation, adjustable power supplies, and switching

power supplies.

The TL1431 is characterized for operation over the full military temperature range of –55°C to 125°C.

ORDERABLE PART NUMBER

TOP-SIDE MARKING

CDIP – JG

Tube of 50

5962-9962001VPA

9962001VPA

–55°C to 125°C

CFP – U

TBD

5962-9962001VHA (Preview)

9962001VHA

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.

SYMBOL

FUNCTIONAL BLOCK DIAGRAM

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2012, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.