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THS770012IRGER Datasheet(PDF) 2 Page - Texas Instruments |
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THS770012IRGER Datasheet(HTML) 2 Page - Texas Instruments |
2 / 35 page THS7700 12IRGE TI YMS LLLL = Pin 1 designator THS7700012IRGE = device name TI = TI LETTERS YM = YEAR MONTH DATE CODE S = ASSEMBLY SITE CODE LLLL = ASSY LOT CODE THS770012 SLOS669C – FEBRUARY 2010 – REVISED JANUARY 2012 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE/ORDERING INFORMATION(1) SPECIFIED PACKAGE PACKAGE PACKAGE ORDERING TRANSPORT PRODUCT TEMPERATURE TYPE DESIGNATOR MARKING NUMBER MEDIA, QUANTITY RANGE THS770012IRGE THS770012IRGET Tape and reel, 250 THS770012 VQFN-24 RGE –40°C to +85°C THS770012IRGE THS770012IRGER Tape and reel, 3000 (1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the device product folder on www.ti.com. Figure 3. DEVICE MARKING INFORMATION ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature range, unless otherwise noted. THS770012 UNIT Power supply (VS+ to GND) 5.5 V Input voltage range Ground to VS+ V Differential input voltage, VID Ground to VS+ V Continuous input current, II 10 mA Continuous output current, IO 100 mA Storage temperature range, Tstg –65°C to +150°C °C Maximum junction temperature, TJ +150 °C Maximum junction temperature, continuous operation, long term reliability +125 °C Human body model (HBM) 2500 V ESD ratings Charged device model (CDM) 1000 V Machine model (MM) 100 V (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. 2 Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Link(s): THS770012 |
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