THS7700

12IRGE

TI YMS

LLLL

= Pin 1 designator

THS7700012IRGE = device name

TI = TI LETTERS

YM = YEAR MONTH DATE CODE

S = ASSEMBLY SITE CODE

LLLL = ASSY LOT CODE

THS770012

SLOS669C

– FEBRUARY 2010 – REVISED JANUARY 2012

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

SPECIFIED

PACKAGE

PACKAGE

PACKAGE

ORDERING

TRANSPORT

PRODUCT

TEMPERATURE

TYPE

DESIGNATOR

MARKING

NUMBER

MEDIA, QUANTITY

RANGE

THS770012IRGE

THS770012IRGET

Tape and reel, 250

THS770012

VQFN-24

RGE

–40°C to +85°C

THS770012IRGE

THS770012IRGER

Tape and reel, 3000

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the

device product folder on www.ti.com.

Figure 3. DEVICE MARKING INFORMATION

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range, unless otherwise noted.

THS770012

UNIT

5.5

V

Input voltage range

V

V

10

mA

100

mA

–65°C to +150°C

°C

+150

°C

Maximum junction temperature, continuous operation, long term reliability

+125

°C

Human body model (HBM)

2500

V

ESD ratings

Charged device model (CDM)

1000

V

Machine model (MM)

100

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

2

Submit Documentation Feedback

Copyright

© 2010–2012, Texas Instruments Incorporated

Product Folder Link(s): THS770012