SN74LVTH32373EP

3.3V ABT 32BIT TRANSPARENT DTYPE LATCH

WITH 3STATE OUTPUTS

SCBS794 − DECEMBER 2003

4

POST OFFICE BOX 655303

−0.5 V to 4.6 V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

−0.5 V to 7 V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Voltage range applied to any output in the high-impedance

−0.5 V to 7 V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

. . . . . . . . . . . . .

128 mA

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

64 mA

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

−50 mA

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

−50 mA

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Package thermal impedance,

40

°C/W

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

−65

°C to 150°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and

functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not

implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

NOTES:

1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.

2. This current flows only when the output is in the high state and VO > VCC.

3. The package thermal impedance is calculated in accordance with JESD 51-7.

4. Long-term high-temperature storage and/or extended use at maximum recommended operating conditions may result in a reduction

of overall device life. See Figure 1 for additional information on thermal derating.

0.000001

0.00001

0.0001

125

°C (16 kHours, 1.84 Years)

115

°C (40 kHours, 4.57 Years)

105

°C (104 kHours, 11.94 Years)

100

°C (172 kHours, 19.65 Years)

Figure 1. Estimated Wirebond Life

Based on Elevated-Temperature Kirkendall-Voiding Failure Mode