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MC33663ALEF Datasheet(PDF) 5 Page - Freescale Semiconductor, Inc |
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MC33663ALEF Datasheet(HTML) 5 Page - Freescale Semiconductor, Inc |
5 / 37 page Analog Integrated Circuit Device Data Freescale Semiconductor 5 33663 ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS Table 3. Maximum Ratings All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or permanent damage to the device. Ratings Symbol Value Unit ELECTRICAL RATINGS Power Supply Voltage (VSUP) Normal Operation (DC) Transient input voltage with external component (according to ISO7637-2 & ISO7637-3 & “Hardware Requirements for LIN, CAN, and Flexray Interfaces in Automotive Applications” specification Rev. 1.1/December 2nd, 2009) (See Table 4 and Figure 4) - Pulse 1 (test up to the limit for Damage - Class A(1)) - Pulse 2a (test up to the limit for Damage - Class A(1)) - Pulse 3a (test up to the limit for Damage - Class A(1)) - Pulse 3b (test up to the limit for Damage - Class A(1)) - Pulse 5b (Class A)(1) VSUP(SS) VSUP(S1) VSUP(S2A) VSUP(S3A) VSUP(S3B) VSUP(S5B) -0.3 to 27 -100 +75 -150 +100 -0.3 to 40 V Logic Voltage (RXD1,2, TXD1,2, EN1,2 Pins) VLOG -0.3 to 5.5 V WAKE (VWAKE1,VWAKE2) Normal Operation with in series 2*18 k resistor (DC) Transient input voltage with external component (according to ISO7637-2 & ISO7637-3 & “Hardware Requirements for LIN, CAN and Flexray Interfaces in Automotive Applications” specification Rev1.1 / December 2nd, 2009) (See Table 4 and Figure 5) - Pulse 1 (test up to the limit for Damage - Class D(2)) - Pulse 2a (test up to the limit for Damage - Class D(2)) - Pulse 3a (test up to the limit for Damage - Class D(2)) - Pulse 3b (test up to the limit for Damage - Class D(2)) VWAKE(SS) VWAKE(S1) VWAKE(S2A) VWAKE(S3A) VWAKE(S3B) -27 to 40 -100 +75 -150 +100 V LIN Bus Voltage (VLIN1, VLIN2) Normal Operation (DC) Transient (Coupled Through 1.0 nF Capacitor) (according to ISO7637-2 & ISO7637-3) (See Table 4 and Figure 6) - Pulse 1 (test up to the limit for Damage - Class D(2)) - Pulse 2a (test up to the limit for Damage - Class D(2)) - Pulse 3a (test up to the limit for Damage - Class D(2)) - Pulse 3b (test up to the limit for Damage - Class D(2)) VLIN(SS) VLIN(S1) VLIN(S2A) VLIN(S3A) VLIN(S3B) -27 to 40 -100 +75 -150 +100 V Notes 1. Class A: All functions of a device/system perform as designed during and after exposure to disturbance. 2. Class D: At least one function of the Transceiver stops working properly during the test and will return into proper operation automatically when the exposure to the disturbance has ended. No physical damage of the IC occurs. |
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