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bq28550DRZT Datasheet(PDF) 7 Page - Texas Instruments |
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bq28550DRZT Datasheet(HTML) 7 Page - Texas Instruments |
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7 / 33 page  bq28550 www.ti.com SLUSAJ2 – SEPTEMBER 2011 INTEGRATING ADC (COULOMB COUNTER) CHARACTERISTICS (continued) TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT INL Integral nonlinearity ±0.007 ±0.034 FSR error ZIN(SR) Effective input 2.5 M Ω resistance(1) Ilkg(SR) Input leakage 0.3 µA current(1) (1) Specified by design. Not production tested. ADC (TEMPERATURE AND CELL VOLTAGE) CHARACTERISTICS TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIN(ADC) Input voltage range –0.2 1 V tCONV(ADC) Conversion time 125 ms Resolution 14 15 bits VOS(ADC) Input offset 1 mV Z(ADC1) Effective input 8 M Ω resistance (TS) (1) Z(ADC2) Effective input bq28550 is not measuring cell voltage. 8 M Ω resistance (BAT) (1) bq28550 is measuring cell voltage. 100 k Ω Ilkg(ADC) Input leakage 0.3 µA current (1) (1) Specified by design. Not production tested. DATA FLASH MEMORY CHARACTERISTICS TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tDR Data retention (1) 10 Years Flash programming 20,000 Cycles write-cycles (1) tWORDPROG Word programming 2 ms time (1) ICCPROG Flash-write supply 5 10 mA current (1) (1) Specified by design. Not production tested. SERIAL COMMUNICATION TIMING CHARACTERISTICS TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted). Capacitance on serial interface pins SCL and SDA are 10 pF unless otherwise specified (1). PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tr SCL/SDA rise time 300 ns tf SCL/SDA fall time 300 ns tw(H) SCL pulse width 600 ns (high) tw(L) SCL pulse width 1.3 μs (low) tsu(STA) Setup for repeated 600 ns start (1) Parameters assured by worst case test program execution in fast mode. Copyright © 2011, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Link(s): bq28550 |
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