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bq27505YZGR-J5 Datasheet(PDF) 6 Page - Texas Instruments |
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bq27505YZGR-J5 Datasheet(HTML) 6 Page - Texas Instruments |
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6 / 41 page  bq27505-J5 SLVSAL4 – MARCH 2011 www.ti.com 3.4 INTERNAL TEMPERATURE SENSOR CHARACTERISTICS TA = –40°C to 85°C, 2.4 V < VCC < 2.6 V; typical values at TA = 25°C and VCC = 2.5 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT GTEMP Temperature sensor voltage gain –2 mV/°C 3.5 HIGH-FREQUENCY OSCILLATOR TA = –40°C to 85°C, 2.4 V < VCC < 2.6 V; typical values at TA = 25°C and VCC = 2.5 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT fOSC Operating frequency 2.097 MHz TA = 0°C to 60°C –2% 0.38% 2% fEIO Frequency error(1) (2) TA = –20°C to 70°C –3% 0.38% 3% TA = –40°C to 85°C –4.5% 0.38% 4.5% tSXO Start-up time(3) 2.5 5 ms (1) The frequency error is measured from 2.097 MHz. (2) The frequency drift is included and measured from the trimmed frequency at VCC = 2.5 V, TA = 25°C. (3) The start-up time is defined as the time it takes for the oscillator output frequency to be within ±3% of typical oscillator frequency. 3.6 LOW-FREQUENCY OSCILLATOR TA = –40°C to 85°C, 2.4 V < VCC < 2.6 V; typical values at TA = 25°C and VCC = 2.5 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT fLOSC Operating frequency 32.768 kHz TA = 0°C to 60°C –1.5% 0.25% 1.5% fLEIO Frequency error(1) (2) TA = –20°C to 70°C –2.5% 0.25% 2.5% TA = –40°C to 85°C –4% 0.25% 4.0% tLSXO Start-up time(3) 500 μs (1) The frequency drift is included and measured from the trimmed frequency at VCC = 2.5 V, TA = 25°C. (2) The frequency error is measured from 32.768 kHz. (3) The start-up time is defined as the time it takes for the oscillator output frequency to be within ±3% of typical oscillator frequency. 3.7 INTEGRATING ADC (COULOMB COUNTER) CHARACTERISTICS TA = –40°C to 85°C, 2.4 V < VCC < 2.6 V; typical values at TA = 25°C and VCC = 2.5 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VSR Input voltage range, V(SRN) and V(SRP) VSR = V(SRN) – V(SRP) –0.125 0.125 V tSR_CONV Conversion time Single conversion 1 s Resolution 14 15 bits VOS(SR) Input offset 10 μV INL Integral nonlinearity error ±0.007 ±0.034 %FSR ZIN(SR) Effective input resistance(1) 2.5 M Ω Ilkg(SR) Input leakage current(1) 0.3 μA (1) Specified by design. Not tested in production. 3.8 ADC (TEMPERATURE AND CELL MEASUREMENT) CHARACTERISTICS TA = –40°C to 85°C, 2.4 V < VCC < 2.6 V; typical values at TA = 25°C and VCC = 2.5 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIN(ADC) Input voltage range –0.2 1 V tADC_CONV Conversion time 125 ms Resolution 14 15 bits VOS(ADC) Input offset 1 mV 6 ELECTRICAL SPECIFICATIONS Copyright © 2011, Texas Instruments Incorporated Submit Documentation Feedback |
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