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NX3P191 Datasheet(PDF) 9 Page - NXP Semiconductors |
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NX3P191 Datasheet(HTML) 9 Page - NXP Semiconductors |
9 / 15 page NX3P191 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 2 — 4 November 2011 9 of 15 NXP Semiconductors NX3P191 Logic controlled high-side power switch Test data is given in Table 12. Definitions test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. VEXT = External voltage for measuring switching times. Fig 13. Test circuit for measuring switching times 001aao354 EN VOUT VIN VI ILOAD VEXT G CL Table 12. Test data Supply voltage Input Load VEXT VI(EN) CL ILOAD 1.1 V to 3.6 V 1.5 V 1 F 200 mA VI(VIN) = 1.8 V; VI(EN) = 1.8 V; CL = 1 F; ILOAD = 200 mA. VI(VIN) = 3.6 V; VI(EN) = 1.8 V; CL = 1.0 F; ILOAD =200 mA. Fig 14. Waveform showing the enable time versus inrush current Fig 15. Waveform showing the enable time versus inrush current aaa-000038 aaa-000039 |
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