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OPA140ATDD2 Datasheet(PDF) 1 Page - Texas Instruments |
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OPA140ATDD2 Datasheet(HTML) 1 Page - Texas Instruments |
1 / 4 page OPA140A-DIE www.ti.com SBOS610B – MARCH 2012 – REVISED MARCH 2012 HIGH-PRECISION, LOW-NOISE, RAIL-TO-RAIL OUTPUT, 11-MHZ JFET OPERATIONAL AMPLIFIER Check for Samples: OPA140A-DIE 1 FEATURES • Very Low Offset Drift APPLICATIONS • Very Low Offset • Battery-Powered Instruments • Low Input Bias Current • Industrial Controls • Very Low 1/f Noise • Medical Instrumentation • Low Noise • Photodiode Amplifiers • Slew Rate • Active Filters • Low Supply Current • Data Acquisition Systems • Input Voltage Range Includes V– Supply • Automatic Test Systems • Single-Supply Operation: 4.5 V to 36 V • Dual-Supply Operation: ±2.25 V to ±18 V • No Phase Reversal DESCRIPTION The OPA140A operational amplifier is a low-power JFET input amplifier that features good drift and low input bias current. The rail-to-rail output swing and input range that includes V– allow designers to take advantage of the low-noise characteristics of JFET amplifiers while also interfacing to modern, single-supply, precision analog- to-digital converters (ADCs) and digital-to-analog converters (DACs). The OPA140A runs on a single 4.5-V to 36-V supply or dual ±2.25-V to ±18-V supplies. ORDERING INFORMATION(1) PACKAGE PRODUCT PACKAGE(2) ORDERABLE PART NUMBER PACKAGE QUANTITY DESIGNATOR OPA140ATDD1 252 OPA140A TD Bare Die In Waffle Pack OPA140ATDD2 10 (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. (2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Copyright © 2012, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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