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ADS1291IPBSR Datasheet(PDF) 2 Page - Texas Instruments |
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ADS1291IPBSR Datasheet(HTML) 2 Page - Texas Instruments |
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2 / 69 page  ADS1291 ADS1292 ADS1292R SBAS502A – DECEMBER 2011 – REVISED MARCH 2012 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. FAMILY AND ORDERING INFORMATION(1) MAXIMUM OPERATING PACKAGE PACKAGE NUMBER OF ADC SAMPLE TEMPERATUR RESPIRATION PRODUCT OPTION DESIGNATOR CHANNELS RESOLUTION RATE (kSPS) E RANGE CIRCUITRY TQFP PBS 1 24 8 –40°C to +85°C No ADS1291I QFN RSM 1 24 8 –40°C to +85°C No TQFP PBS 2 24 8 –40°C to +85°C No ADS1292I QFN RSM 2 24 8 –40°C to +85°C No TQFP PBS 2 24 8 –40°C to +85°C Yes ADS1292RI QFN RSM 2 24 8 –40°C to +85°C Yes (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the device product folder at www.ti.com. ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature range, unless otherwise noted. ADS1291, ADS1292, ADS1292R UNIT AVDD to AVSS –0.3 to +5.5 V DVDD to DGND –0.3 to +3.9 V AGND to DGND –0.3 to +0.3 V Analog input to AVSS AVSS – 0.3 to AVDD + 0.3 V Digital input to DVDD DVSS – 0.3 to DVDD + 0.3 V Input current to any pin except supply pins ±10 mA Momentary ±100 mA Input current Continuous ±10 mA Operating temperature range –40 to +85 °C Storage temperature range –60 to +150 °C Maximum junction temperature (TJ) +150 °C Human body model (HBM) ±1000 V JEDEC standard 22, test method A114-C.01, all pins ESD ratings Charged device model (CDM) ±500 V JEDEC standard 22, test method C101, all pins (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. 2 Submit Documentation Feedback Copyright © 2011–2012, Texas Instruments Incorporated Product Folder Link(s): ADS1291 ADS1292 ADS1292R |
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