ADIS16485

Data Sheet

Rev. 0 | Page 4 of 28

Parameter

Test Conditions/Comments

Min

Typ

Max

Unit

FLASH MEMORY

Endurance2

100,000

Cycles

Data Retention3

20

Years

FUNCTIONAL TIMES4

Time until data is available

Power-On, Start-Up Time

400 ± 160

ms

Reset Recovery Time

400 ± 160

ms

Sleep Mode Recovery Time

500

µs

Flash Memory Update Time

900

ms

Flash Memory Test Time

66

ms

Automatic Self Test Time

Using internal clock, 100 SPS

12

ms

CONVERSION RATE

2.46

kSPS

Initial Clock Accuracy

0.02

%

Temperature Coefficient

40

ppm/°C

Sync Input Clock5

0.7

2.4

kHz

POWER SUPPLY, VDD

Operating voltage range

3.0

3.6

V

Power Supply Current6

Normal mode, VDD = 3.3 V, µ ± σ

197

mA

Sleep mode, VDD = 3.3 V

12.2

mA

Power-down mode, VDD = 3.3 V

37

µA

POWER SUPPLY, VDDRTC

Operating voltage range

3.0

3.6

V

Real-Time Clock Supply Current

Normal mode, VDDRTC = 3.3 V

13

µA

1

The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant.

2

Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.

3

4

These times do not include thermal settling and internal filter response times, which may affect overall accuracy.

5

The device functions at clock rates below 0.7 kHz but at reduced performance levels.

6

Supply current transients can reach 450 mA for 400 µs during start-up and reset recovery.