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| ELF-512SYGWA-S530-E2 |
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 EVERLIGHT
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5 page 
EVERLIGHT ELECTRONICS CO.,LTD. Technical Data Sheet 0.56" Quadruple Digit Displays ELF-512SYGWA/S530-E2 █ Reliability test items and conditions: The reliability of products shall be satisfied with items listed below. Confidence level：97% LTPD：3% NO Item Test Conditions Test Hours/Cycle Sample Size Failure Judgment Criteria Ac/Re 1 Solder Heat TEMP : 260℃ ± 5 ℃ 5 SEC 76 PCS 0/1 H : +85℃ 30min 2 Temperature Cycle ∫ 5 min 50 CYCLE 76 PCS 0/1 L : -55℃ 30min H : +100℃ 5min 3 Thermal Shock ∫ 10 sec 50 CYCLE 76 PCS 0/1 L : -10℃ 5min 4 High Temperature Storage TEMP : 100℃ 1000 HRS 76 PCS 0/1 5 Low Temperature Storage TEMP : -55℃ 1000 HRS 76 PCS 0/1 6 DC Operating Life IF = 10 mA 1000 HRS 76 PCS 0/1 7 High Temperature / High Humidity 85℃/85% RH 1000 HRS 76 PCS 0/1 Note： Ivt：The test Iv value of the chip before the reliablility test Iv：The test value of the chip that has completed the reliablility test U：Upper Specification Limit L： Lower Specification Limit http : //www.everlight.com Rev. : 1 Page: 5 of 6 Device Number : CDDF-512-036 Prepared date:2005/08/24 Prepared by: YanLi Zhong Iv≦Ivt*0.5 or Vf≧U or Vf≦L EVERLIGHT ELECTRONICS CO.,LTD. |
