DS28EC20: 20Kb 1-Wire EEPROM

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PARAMETER

SYMBOL

CONDITIONS

MIN

TYP

MAX

UNITS

EEPROM

Programming Current

(Note 19)

0.9

mA

Programming Time

(Note 20)

10

ms

Write/Erase Cycles

(Endurance) (Notes 21,

22)

At +25°C

200k



At +85°C (worst case)

50k

Data Retention

(Notes 23, 24, 25)

At +85°C (worst case)

40

years

Note 1:

supply voltage range are guaranteed by design and characterization. Typical values are not guaranteed.

Note 2:

System requirement.

Note 3:

Maximum allowable pullup resistance is a function of the number of 1-Wire devices in the system, 1-Wire recovery times, and

current requirements during EEPROM programming. The specified value here applies to systems with only one device and with

the minimum 1-Wire recovery times. For more heavily loaded systems, an active pullup such as that found in the DS2482-x00,

DS2480B, or DS2490 may be required.

Note 4:

does not affect normal communication.

Note 5:

Guaranteed by design, characterization and/or simulation only. Not production tested.

Note 6:

Note 7:

Voltage below which, during a falling edge on I/O, a logic 0 is detected.

Note 8:

Note 9:

Voltage above which, during a rising edge on I/O, a logic 1 is detected.

Note 10:

Note 11:

The I-V characteristic is approximately linear for voltages less than 1V.

Note 12:

Applies to a single device attached to a 1-Wire line.

Note 13:

Note 14:

Note 15:

detect pulse could be outside this interval but will be complete within 2ms after power-up.

Note 16:

Highlighted numbers are NOT in compliance with legacy 1-Wire product standards. See comparison table below.

Note 17:

ε

Note 18:

δ

Note 19:

minimum voltage requirements for programming.

Note 20:

sequence. Interval ends once the device's self-timed EEPROM programming cycle is complete and the current drawn by the

Note 21:

Note 22:

Not 100% production-tested; guaranteed by reliability monitor sampling.

Note 23:

Note 24:

Guaranteed by 100% production test at elevated temperature for a shorter time; equivalence of this production test to data sheet

limit at operating temperature range is established by reliability testing.

Note 25:

EEPROM writes may become nonfunctional after the data retention time is exceeded. Long-time storage at elevated

temperatures is not recommended; the device may lose its write capability after 10 years at +125°C or 40 years at +85°C.

LEGACY VALUES

DS28EC20 VALUES

PARAMETER

STANDARD SPEED

OVERDRIVE SPEED#

STANDARD SPEED

OVERDRIVE SPEED#

MIN

MAX

MIN

MAX

MIN

MAX

MIN

MAX

61µs

(undefined)

7µs

(undefined)

65µs*

(undefined)

11µs

(undefined)

480µs

(undefined)

48µs

80µs

480µs

640µs

48µs

80µs

15µs

60µs

2µs

6µs

15µs

60µs

2µs

6µs

60µs

240µs

8µs

24µs

60µs

240µs

8µs

24µs

60µs

120µs

6µs

16µs

60µs

120µs

6µs

15.5µs

*Intentional change, longer recovery time requirement due to modified 1-Wire front-end.