CC2540F128, CC2540F256

SWRS084B

– OCTOBER 2010 – REVISED JULY 2011

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16-MHz RC OSCILLATOR

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

16

MHz

Uncalibrated frequency accuracy

±18%

Calibrated frequency accuracy

±0.6%

Start-up time

10

μs

50

μs

(1)

The calibrated 16-MHz RC oscillator frequency is the 32-MHz XTAL frequency divided by 2.

(2)

When the 16-MHz RC oscillator is enabled, it is calibrated when a switch from the 16-MHz RC oscillator to the 32-MHz crystal oscillator

is performed while SLEEPCMD.OSC_PD is set to 0.

RSSI CHARACTERISTICS

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

High-gain mode

–99 to –44

dBm

Standard mode

–90 to –35

High-gain mode

±4

dB

Step size (LSB value)

1

dB

(1)

Assuming CC2540 EM reference design. Other RF designs give an offset from the reported value.

FREQUENCY SYNTHESIZER CHARACTERISTICS

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

At

±1-MHz offset from carrier

–109

Phase noise, unmodulated

At

±3-MHz offset from carrier

–112

dBc/Hz

carrier

At

±5-MHz offset from carrier

–119

ANALOG TEMPERATURE SENSOR

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Output

1480

12-bit

Temperature coefficient

4.5

mv/

°C

Voltage coefficient

1

/ 0.1 V

Measured using integrated ADC, internal band-gap voltage

reference, and maximum resolution

Initial accuracy without calibration

±10

°C

Accuracy using 1-point calibration

±5

°C

Current consumption when enabled

0.5

mA

8

Copyright

© 2010–2011, Texas Instruments Incorporated