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HT46R005 Datasheet(PDF) 8 Page - Holtek Semiconductor Inc |
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HT46R005 Datasheet(HTML) 8 Page - Holtek Semiconductor Inc |
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8 / 62 page  HT46R005 Pin Name Function OPT I/T O/T Description PA0/BZ/AN0 PA0 PAPU PAWK ST CMOS General purpose I/O. Register enabled pull-up and wake-up. BZ CTRL0 ¾ CMOS Buzzer output pin AN0 ADCR AN ¾ A/D channel 0 PA1/BZ /AN1 PA1 PAPU PAWK ST CMOS General purpose I/O. Register enabled pull-up and wake-up. BZ CTRL0 ¾¾ Buzzer complementary output pin AN1 ADCR AN ¾ A/D channel 1 PA2/TMR/INT/AN2 PA2 PAPU PAWK ST CMOS General purpose I/O. Register enabled pull-up and wake-up. TMR ¾ ST ¾ External Timer clock input INT ¾ ST ¾ External interrupt input AN2 ADCR AN ¾ A/D channel 2 PA5/OSC2 PA5 PAPU PAWK ST CMOS General purpose I/O. Register enabled pull-up and wake-up. OSC2 CO ¾ OSC Oscillator pin PA6/OSC1 PA6 PAPU PAWK ST CMOS General purpose I/O. Register enabled pull-up and wake-up. OSC1 CO OSC ¾ Oscillator pin PA7/RES PA7 PAWK ST NMOS General purpose I/O. Register enabled wake-up. RES CO ST ¾ Reset input VDD VDD ¾ PWR ¾ Power supply VSS VSS ¾ PWR ¾ Ground Note: I/T: Input type O/T: Output type OPT: Optional by configuration option (CO) or register option PWR: Power CO: Configuration option ST: Schmitt Trigger input CMOS: CMOS output AN: Analog input pin Absolute Maximum Ratings Supply Voltage ...........................VSS -0.3V to VSS+6.0V Storage Temperature ............................ -50°Cto125°C Input Voltage..............................VSS -0.3V to VDD+0.3V Operating Temperature........................... -40°Cto85°C IOL Total ..............................................................100mA IOH Total............................................................ -100mA Total Power Dissipation .....................................500mW Note: These are stress ratings only. Stresses exceeding the range specified under ²Absolute Maximum Ratings² may cause substantial damage to the device. Functional operation of this device at other conditions beyond those listed in the specification is not implied and prolonged exposure to extreme conditions may affect device reliability. HT48R005/HT46R005 Rev. 1.00 8 November 29, 2011 |
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