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GS1545-CQR Datasheet(PDF) 4 Page - Gennum Corporation |
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GS1545-CQR Datasheet(HTML) 4 Page - Gennum Corporation |
4 / 19 page GENNUM CORPORATION 522 - 28 - 05 4 of 19 AC ELECTRICAL CHARACTERISTICS - RECLOCKER STAGE VCC = 5V, TA = 25°C PARAMETER CONDITIONS SYMBOL MIN TYP MAX UNITS TEST LEVEL Serial Input – Data Rate SMPTE 292M BRSDI 1.485/1.001 1.485 - Gb/s 3 Serial Input – Jitter Tolerance Sinewave Modulation (p – p) JTOL 0.5 0.6 - UI 9 Phase Lock Time - Asynchronous Loop bandwidth approximately 1.4MHz @ 0.2 UI input jitter modulation (LBCONT floating). TALOCK - 120 145 ms 7 Phase Lock Time - Synchronous Loop bandwidth approximately 1.4MHz @ 0.2 UI input jitter modulation (LBCONT floating). TSLOCK -2 3.2 µs 7 Carrier Detect Response Time Loop bandwidth approximately 1.4MHz @ 0.2 UI input jitter modulation (LBCONT floating). -12 14 ms 7 Phase Lock/Unlock Time (1nF PLCAP) Loop bandwidth approximately 1.4MHz @ 0.2 UI input jitter modulation (LBCONT floating). 80 - - µs 7 Digital Data Output (DDO) – Signal Swing VDDO 355 400 480 mV 1 Digital Data Output (DDO) – Rise and Fall Time tR-DDO, tF-DDO - 160 - ps 7 Digital Data Output (DDO) – Rise and Fall Time Mismatch -30 - ps 7 Digital Data Output (DDO) – Intrinsic Jitter (RMS Jitter for clean PRN 2 23 – 1 input on DDI/DDI inputs) tIJ -10 - ps 9 Loop bandwidth @ 0.2UI jitter modulation LBCONT floating 1.2 1.4 1.5 MHz 7 Jitter peaking -- 0.1 dB 7 TEST LEVELS 1. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges. 2. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges using correlated test. 3. Production test at room temperature and nominal supply voltage. 4. QA sample test. 5. Calculated result based on Level 1,2, or 3. 6. Not tested. Guaranteed by design simulations. 7. Not tested. Based on characterization of nominal parts. 8. Not tested. Based on existing design/characterization data of similar product. 9. Indirect test. |
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