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2010.01 - Rev.G

Data Sheet

TCFG Series B Case

Temperature

Stability

−

Less than 1250% of initial limit

+125°C

Apply the specified surge voltage

via the serial

resistance of 1k

Ω every 5±0.5min.

for 30

±5 s. each time in the atmospheric condition

of 85

±2°C.

Repeat this procedure 1,000 times.

After the specimens, leave it at room temperature

for over 24h and then measure the sample.

Surge

Voltage

There should be no significant abnormality.

The indications should be clear.

−55°C

+85°C

Shall be satisfied the value on Table5

Shall be satisfied the value on Table5

Less than 1000% of intial limit

Shall be satisfied the value on Table5

Loading at

High

temperature

There should be no significant abnormality.

The indications should be clear.

After applying the rated voltage for 2000+72/0h

without discontinuation via the serial resistance

of 3

Ω or less at a temperature of 85±2°C, leave

the sample at room temperature/humidity for

1 to 2h and measure the value.

After the specimens, leave it at room temperature

for over 24h and then measure the sample.

Terminal

Strength

The measured value should be stable.

A force is applied to the terminal until it bends

to 1mm and by a prescribed tool maintain the

condition for 5s. (See the figure below.)

Temp.

ΔC / C

L.C

Temp.

ΔC / C

tan

δ

L.C

ΔC / C

L.C

Temp.

Appearance

ΔC / C

tan

δ

L.C

tan

δ

tan

δ

Appearance

ΔC / C

L.C

tan

δ

Capacitance

Appearance There should be no significant abnormality.

1

F (Apply force)

(Unit : mm)

20

50

R230

45

45

Thickness 1.6mm

Adhesiveness

The terminal should not come off.

Apply force of 5N in the two directions shown

in the figure below for 10

±1s after mounting

the terminal on a circuit board.

Apply force

a circuit board

product

As per 4.29 JIS C 5101-1

As per 4.13 JIS C 5101-3

As per 4.26 JIS C 5101-1

As per 4.14 JIS C 5101-3

As per 4.23 JIS C 5101-1

As per 4.15 JIS C 5101-3

As per 4.35 JIS C 5101-1

As per 4.9 JIS C 5101-3

As per 4.34 JIS C 5101-1

As per 4.8 JIS C 5101-3

Item

Performance

Test conditions

(based on JIS C5101-1 and JIS C5101-3)

TCFGB0G227M8R

TCFGB0J227M8R

TCFGB1A107M8R

Others

: Within 0/-15% of initial value

: Within 0/-30% of initial value

: Within 0/-30% of initial value

: Within 0/-12% of initial value

TCFGB0G227M8R

TCFGB0J227M8R

TCFGB1A107M8R

Others

: Within +12/0% of initial value

: Within +15/0% of initial value

: Within +15/0% of initial value

: Within +10/0% of initial value

TCFGB0J227M8R

TCFGB1A107M8R

TCFGB1C336M8R

Others

: Within +20/0% of initial value

: Within +20/0% of initial value

: Within +20/0% of initial value

: Within +15/0% of initial value

: Less than 150% of initial limit

: Less than 200% of initial limit

: Less than 200% of initial limit

: Less than 150% of initial limit

: Less than initial limit

TCFGB0G227M8R

TCFGB0J227M8R

TCFGB1A107M8R

TCFGB1E475M8R

Others

TCFGB0E227M8R

TCFGB0G227M8R

TCFGB0J227M8R

TCFGB1A107M8R

Others

: Within

: Within

: Within

: Within

: Within

3.3 to 33

μF

47 to 150

μF

TCFGB0G227M8R

TCFGB0J227M8R

TCFGB1A107M8R

TCFGB1C336M8R

: Less than initial limit

: Less than 150% of initial limit

: Less than 200% of initial limit

: Less than 200% of initial limit

: Less than 200% of initial limit

: Less than 150% of initial limit

TCFGB0E227M8R

TCFGB0G227M8R

TCFGB0J227M8R

TCFGB1A107M8R

TCFGB1E475M8R

Others

: Less than 125% of initial limit

: Less than 150% of initial limit

: Less than 200% of initial limit

: Less than 200% of initial limit

: Less than 150% of initial limit

: Less than initial limit

TCFGB0G227M8R

TCFGB0J227M8R

TCFGB1A107M8R

Others

: Within

: Within

: Within

: Within

3.3 to 33

μF

47 to 100

μF

TCFGB0E227M8R

TCFGB0G227M8R

TCFGB0J227M8R

TCFGB1A107M8R

TCFGB1C336M8R

: Less than initial limit

: Less than 150% of initial limit

: Less than 150% of initial limit

: Less than 200% of initial limit

: Less than 200% of initial limit

: Less than 200% of initial limit

: Less than 150% of initial limit