AC CHARACTERISTICS

1

±10%)

PARAMETER

SYMBOL

80 ns

100 ns

UNIT

NOTE

MIN.

MAX.

MIN.

MAX.

Read cycle time

80

100

ns

Address access time

80

100

ns

Chip enable

access time

80

100

ns

80

100

ns

Output enable access time

40

40

ns

Output hold time

10

10

ns

Chip enable to

output in Low-Z

10

10

ns

1

10

10

ns

1

Output enable to output in

Low-Z

5

5

ns

1

Chip enable to

output in High-Z

0

30

0

30

ns

1

0

30

0

30

ns

1

Output disable to output in

High-Z

0

20

0

20

ns

1

PARAMETER

SYMBOL

80 ns

100 ns

UNIT

NOTE

MIN.

MAX.

MIN.

MAX.

Write cycle time

80

100

ns

Chip enable to end of write

70

80

ns

Address valid to end of write

70

80

ns

Address setup time

00

ns

Write pulse width

60

60

ns

Write recovery time

00

ns

Data valid to end of write

40

40

ns

Data hold time

00

ns

Output active from end of write

10

10

ns

2

WE to output in High-Z

030030

ns2

OE to output in High-Z

020020

ns2

NOTES:

1.

2.

Active output to high-impedance and high-impedance to output active tests specified for a

±200 mV transition

from steady state levels into the test load.

AC TEST CONDITIONS

PARAMETER

MODE

NOTE

Input voltage amplitude

0.6 to 2.4 V

Input rise/fall time

10 ns

Timing reference level

1.5 V

Output load conditions

1

NOTE:

1.

Includes scope and jig capacitance.

LH5164A/AH

CMOS 64K (8K

× 8) Static RAM

4