11

FN8158.3

February 13, 2008

SYMBOL

PARAMETER

TEST CONDITIONS

MIN

(Note 13)

TYP

MAX

(Note 13)

UNITS

(active)

400

µA

(nonvolatile write)

15

mA

3µA

Input Leakage Current

10

µA

Output Leakage Current

10

µA

Input HIGH Voltage

V

Input LOW Voltage

-1

V

Output LOW Voltage

0.4

V

Output HIGH Voltage

V

Output HIGH Voltage

V

Endurance and Data Retention

PARAMETER

MIN

UNITS

Minimum Endurance

100,000

Data changes per bit per register

Data Retention

100

years

Capacitance

SYMBOL

TEST

TEST CONDITIONS

MAX

UNITS

Input/Output Capacitance (SI)

8

pF

Output Capacitance (SO)

8

pF

Input Capacitance (A0, CS, WP, HOLD, and SCK)

6

pF

Power-up Timing

SYMBOL

PARAMETER

MIN

MAX

UNITS

0.2

50

V/ms

Power-up to Initiation of Read Operation

1

ms

Power-up to Initiation of Write Operation

50

ms

NOTES:

10. Limits established by characterization and are not production tested.

13. Parts are 100% tested at +25°C. Over-temperature limits established by characterization and are not production tested.

A.C. Test Conditions

Input Rise and Fall Times

10ns

Input and Output Timing Level

X9110