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CY62148ELL-55SXA Datasheet(PDF) 6 Page - Cypress Semiconductor |
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CY62148ELL-55SXA Datasheet(HTML) 6 Page - Cypress Semiconductor |
6 / 16 page CY62148E MoBL® Document #: 38-05442 Rev. *I Page 6 of 16 Data Retention Characteristics Over the operating range Parameter Description Conditions Min Typ[12] Max Unit VDR VCC for data retention 2 – – V ICCDR[13] Data retention current VCC = VDR, CE > VCC – 0.2 V, VIN > VCC – 0.2 V or VIN < 0.2 V Industrial / Automotive-A –1 7 µA tCDR Chip deselect to data retention time 0 – – ns tR[14] Operation recovery time TSOP II 45 – – ns SOIC 55 – – ns Figure 3. Data Retention Waveform VCC(min) VCC(min) tCDR VDR > 2.0 V DATA RETENTION MODE tR VCC CE Notes 12. Typical values are included for reference and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 °C. 13. Chip enable (CE) must be HIGH at CMOS level to meet the ISB2 / ICCDR spec. Other inputs can be left floating. 14. Full device operation requires linear VCC ramp from VDR to VCC(min) > 100 µs or stable at VCC(min) > 100 µs. [+] Feedback |
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