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HEF40175B Datasheet(PDF) 8 Page - NXP Semiconductors |
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HEF40175B Datasheet(HTML) 8 Page - NXP Semiconductors |
8 / 15 page HEF40175B All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 7 — 3 May 2011 8 of 15 NXP Semiconductors HEF40175B Quad D-type flip-flop a. Input waveforms b. Test circuit Test and measurement data is given in Table 9 Definitions test circuit: DUT = Device Under Test; RT = Termination resistance should be equal to output impedance Zo of the pulse generator; CL = Load capacitance including jig and probe capacitance. Fig 6. Test circuit for measuring switching times VM VM tW tW 10 % 90 % 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % 90 % 10 % tf tr tr tf 001aaj781 VDD VI VO 001aag182 DUT CL RT G Table 9. Measurement points and test data Supply voltage Input Load VDD VI tr, tf CL 5 V to 15 V VSS or VDD ≤ 20 ns 50 pF |
Similar Part No. - HEF40175B_11 |
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Similar Description - HEF40175B_11 |
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