HEF40175B

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© NXP B.V. 2011. All rights reserved.

Product data sheet

Rev. 7 — 3 May 2011

8 of 15

NXP Semiconductors

HEF40175B

Quad D-type flip-flop

a. Input waveforms

b. Test circuit

Test and measurement data is given in Table 9

Definitions test circuit:

DUT = Device Under Test;

Fig 6.

Test circuit for measuring switching times

10 %

90 %

10 %

90 %

0 V

negative

pulse

positive

pulse

0 V

90 %

10 %

90 %

10 %

001aaj781

001aag182

DUT

CL

RT

G

Table 9.

Measurement points and test data

Supply voltage

Input

Load

5 V to 15 V

≤ 20 ns

50 pF