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MASW-003102-13590G Datasheet(PDF) 1 Page - M/A-COM Technology Solutions, Inc. |
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MASW-003102-13590G Datasheet(HTML) 1 Page - M/A-COM Technology Solutions, Inc. |
1 / 7 page 1 HMIC™ Silicon PIN Diode Switches with Integrated Bias Network Rev. V5 MASW-002102-13580 MASW-003102-13590 • North America Tel: 800.366.2266 • Europe Tel: +353.21.244.6400 • India Tel: +91.80.43537383 • China Tel: +86.21.2407.1588 Visit www.macomtech.com for additional data sheets and product information. M/A-COM Technology Solutions Inc. and its affiliates reserve the right to make changes to the product(s) or information contained herein without notice. ADVANCED: Data Sheets contain information regarding a product M/A-COM Technology Solutions is considering for development. Performance is based on target specifications, simulated results, and/or prototype measurements. Commitment to develop is not guaranteed. PRELIMINARY: Data Sheets contain information regarding a product M/A-COM Technology Solutions has under development. Performance is based on engineering tests. Specifications are typical. Mechanical outline has been fixed. Engineering samples and/or test data may be available. Commitment to produce in volume is not guaranteed. Parameter Absolute Maximum Operating Temperature -65oC to +125oC Storage Temperature -65oC to +150oC Junction Temperature +175oC Applied Reverse Voltage 50V RF Incident Power +33dBm C.W. Bias Current +25°C ±20mA Max. operating conditions for a combination of RF power, D.C. bias and temperature: +33dBm CW @ 15mA (per diode) @+85°C MASW-002102-13580 MASW-003102-13590 Features Broad Bandwidth Specified up to 18 GHz Usable up to 26 GHz Integrated Bias Network Low Insertion Loss / High Isolation Rugged Fully Monolithic Glass Encapsulate Construction RoHS Compliant* and 260°C Reflow Compatible Description The MASW-002102-13580 and MASW-003102-13590 devices are SP2T and SP3T broad band switches with integrated bias networks utilizing M/A-COM Technology Solutions HMICTM (Heterolithic Microwave Integrated Circuit) process, US Patent 5,268,310. This process allows the incorporation of silicon pedestals that form series and shunt diodes or vias by imbedding them in low loss, low dispersion glass. By using small spacing between elements, this combination of silicon and glass gives HMIC devices low loss and high isolation per- formance with exceptional repeatability through low millimeter frequencies. Large bond pads facilitate the use of low inductance ribbon bonds, while gold back- side metallization allows for manual or automatic chip bonding via 80/20 - Au/Sn, 62/36/2 - Sn/Pb/Ag solders or electrically conductive silver epoxy. Yellow areas denote wire bond pads * Restrictions on Hazardous Substances, European Union Directive 2002/95/EC. |
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