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K7J321882C Datasheet(PDF) 10 Page - Samsung semiconductor |
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K7J321882C Datasheet(HTML) 10 Page - Samsung semiconductor |
10 / 18 page 1Mx36 & 2Mx18 DDR II SIO b2 SRAM - 10 - Rev. 1.1 August 2006 K7J323682C K7J321882C DC ELECTRICAL CHARACTERISTICS Notes: 1. Minimum cycle. IOUT=0mA. 2. |IOH|=(VDDQ/2)/(RQ/5) ±15% for 175Ω ≤ RQ ≤ 350Ω. 3. |IOL|=(VDDQ/2)/(RQ/5) ±15% for 175Ω ≤ RQ ≤ 350Ω. 4. Minimum Impedance Mode when ZQ pin is connected to VDD. 5. Operating current is calculated with 50% read cycles and 50% write cycles. 6. Standby Current is only after all pending read and write burst operations are completed. 7. Programmable Impedance Mode. 8. These are DC test criteria. DC design criteria is VREF ±50mV. The AC VIH/VIL levels are defined separately for measuring timing parameters. 9. VIL (Min.) DC= -0.3V, VIL (Min)AC=-1.5V(pulse width ≤ 3ns). 10. VIH (Max)DC= VDDQ+0.3, VIH (Max)AC=VDDQ+0.85V(pulse width ≤ 3ns). PARAMETER SYMBOL TEST CONDITIONS MIN MAX UNIT NOTES Input Leakage Current IIL VDD=Max; VIN=VSS to VDDQ -2 +2 µA Output Leakage Current IOL Output Disabled, -2 +2 µA Operating Current (x36) ICC VDD=Max, IOUT=0mA Cycle Time ≥ tKHKH Min. -33 750 mA 1,5 -30 - 700 -25 - 650 Operating Current (x18) ICC VDD=Max, IOUT=0mA Cycle Time ≥ tKHKH Min. -33 700 mA 1,5 -30 - 650 -25 - 600 Standby Current (NOP) ISB1 Device deselected, IOUT=0mA, f=Max, All Inputs ≤0.2V or ≥ VDD-0.2V -33 300 mA 1,6 -30 - 280 -25 - 250 Output High Voltage VOH1 VDDQ/2-0.12 VDDQ/2+0.12 V 2,7 Output Low Voltage VOL1 VDDQ/2-0.12 VDDQ/2+0.12 V 3,7 Output High Voltage VOH2 IOH=-1.0mA VDDQ-0.2 VDDQ V4 Output Low Voltage VOL2 IOL=1.0mA VSS 0.2 V 4 Input Low Voltage VIL -0.3 VREF-0.1 V 8,9 Input High Voltage VIH VREF+0.1 VDDQ+0.3 V 8,10 ABSOLUTE MAXIMUM RATINGS* *Note: 1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operating sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. VDDQ must not exceed VDD during normal operation. PARAMETER SYMBOL RATING UNIT Voltage on VDD Supply Relative to VSS VDD -0.5 to 2.9 V Voltage on VDDQ Supply Relative to VSS VDDQ -0.5 to VDD V Voltage on Input Pin Relative to VSS VIN -0.5 to VDD+0.3 V Storage Temperature TSTG -65 to 150 °C Operating Temperature Commercial / Industrial TOPR 0 to 70 / -40 to 85 °C Storage Temperature Range Under Bias TBIAS -10 to 85 °C OPERATING CONDITIONS PARAMETER SYMBOL Min. MAX UNIT Supply Voltage VDD 1.7 1.9 V VDDQ 1.4 1.9 V Reference Voltage VREF 0.68 0.95 V |
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