K7D161874B-HC27 datasheet(9/16 Pages) SAMSUNG

Part #	K7D161874B-HC27

Description	512Kx36 & 1Mx18 SRAM

Download	16 Pages

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Manufacturer	SAMSUNG [Samsung semiconductor]

Direct Link	http://www.samsung.com/Products/Semiconductor

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9 / 16 page

Rev 1.1

512Kx36 & 1Mx18 SRAM

- 9 -

Jan. 2005

K7D161874B

K7D163674B

PIN CAPACITANCE

NOTE : Periodically sampled and not 100% tested.(TA=25

°C, f=1MHz)

Parameter

Symbol

Test Condition

TYP

Max

Unit

Input Capacitance

CIN

VIN=0V

-

4

pF

Data Output Capacitance

COUT

VOUT=0V

-

5

pF

AC TEST CONDITIONS(TA=0 to 70°C, VDD=1.7 -2.63V, VDDQ=1.5V)

Parameter

Symbol

Value

Unit

Note

Input High/Low Level

VIH/VIL

1.25/0.25

V

-

Input Reference Level

VREF

0.75

V

-

Input Rise/Fall Time

TR/TF

0.5/0.5

ns

-

Output Timing Reference Level

0.75

V

-

Clock Input Timing Reference Level

Cross Point

V

-

Output Load

See Below

-

AC INPUT CHARACTERISTICS

Parameter

Symbol

Min

Max

Unit

Note

AC Input Logic High

VIH (AC)

VREF + 0.4

V

-

AC Input Logic Low

VIL (AC)

VREF - 0.4

V

-

Clock Input Differential Voltage

VDIF (AC)

0.8

V

-

VREF Peak-to-Peak AC Voltage

VREF (AC)

5% VREF (DC)

V

-

CK

VIH(AC)

VREF

VIL(AC)

AC INPUT DEFINITION

Setup

Time

Hold

Time

VDIF(AC)

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