Document #: 001-08029 Rev. *I

Page 4 of 16

Maximum Ratings

Exceeding maximum ratings may impair the useful life of the

device. These user guidelines are not tested.

Storage temperature................................. –65 °C to +150 °C

Ambient temperature with

power applied ........................................... –55 °C to +125 °C

Supply voltage to ground

potential ..........................................................–0.3 V to 3.9 V

DC voltage applied to outputs

in High-Z State [4, 5] ........................................–0.3 V to 3.9 V

Output current into outputs (LOW) .............................. 20 mA

Static Discharge Voltage......................................... > 2001 V

(MIL-STD-883, Method 3015)

Latch-up current ..................................................... > 200 mA

Product

Range

Ambient

Temperature

CY62138FV30LL Ind’l/Auto-A –40 °C to +85 °C 2.2 V to 3.6 V

Parameter

Description

Test Conditions

45 ns (Ind’l/Auto-A)

Unit

Min

Typ [7]

Max

Output HIGH voltage

2.0

–

–

V

2.4

–

–

V

Output LOW voltage

–

–

0.4

V

–

0.4

V

Input HIGH voltage

1.8

–

V

2.2

–

V

Input LOW voltage

–0.3

–

0.6

V

–0.3

–

0.8

V

–0.3

–

0.6

V

Input leakage current

–1

–

+1

A

Output leakage current

output disabled

–1

–

+1

A

CMOS levels

–13

18

mA

f = 1 MHz

–

1.6

2.5

Automatic CE Power-down

Current CMOS inputs

–1

5

A

Automatic CE Power-down

Current CMOS inputs

–1

5

A

Capacitance

Parameter[9]

Description

Test Conditions

Max

Unit

Input Capacitance

10

pF

Output Capacitance

10

pF

Notes

6. Full device AC operation assumes a 100

9. Tested initially and after any design or process changes that may affect these parameters.

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