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C320C102M55HA Datasheet(PDF) 7 Page - Kemet Corporation |
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C320C102M55HA Datasheet(HTML) 7 Page - Kemet Corporation |
7 / 16 page © KEMET Electronics Corporation, P.O. Box 5928, Greenville, S.C. 29606, (864) 963-6300 10 CERAMIC CONFORMALLY COATED/AXIAL “AXIMAX” & GOLD MAX GENERAL SPECIFICATIONS Working Voltage: Axial (WVDC) C0G 50, 100, 200 X7R 25, 50, 100, 200, 250 Z5U 50, 100 Radial (WVDC) C0G 50, 100, 200, 500, 1k, 1.5k, 2k, 2.5k, 3k X7R 25, 50, 100, 200, 250, 500, 1k, 1.5k, 2k, 2.5k, 3k Z5U 50, 100 Temperature Characteristics: C0G 0 ±30 PPM / °C from -55°C to +125°C (1) X7R ± 15% from -55°C to +125°C Z5U + 22%, -56% from +10°C to +85°C Capacitance Tolerance: C0G ±0.5pF, ±1%, ±2%, ±5%, ±10%, ±20% X7R ±10%, ±20%, +80% / -20% Z5U ±20%, 80% / -20% Construction: Epoxy encapsulated – meets flame test requirements of UL Standard 94V-0. High-temperature solder – meets EIA RS-198, Method 302, Condition B (260°C for 10 seconds) Lead Material: Standard: 100% matte tin (Sn) with nickel (Ni) underplate and steel core ( “TA” designation). Alternative 1: 60% Tin (Sn)/40% Lead (Pb) finish with copper- clad steel core ( “HA” designation). Alternative 2: 60% Tin (Sn)/40% Lead (Pb) finish with 100% copper core (available with “HA” termination code with c-spec) Solderability: EIA RS-198, Method 301, Solder Temperature: 230°C ±5°C. Dwell time in solder = 7 ± seconds. Terminal Strength: EIA RS-198, Method 303, Condition A (2.2kg) ELECTRICAL Capacitance @ 25°C: Within specified tolerance and following test conditions. C0G – >1000pF with 1.0 vrms @ 1 kHz 1000pF with 1.0 vrms @ 1 MHz X7R – with 1.0 vrms @ 1 kHz (Referee Time: 1,000 hours) Z5U – with 1.0 vrms @ 1 kHz Dissipation Factor @25°C: Same test conditions as capacitance. C0G – 0.10% maximum X7R – 2.5% maximum (3.5% for 25V) Z5U – 4.0% maximum Insulation Resistance @25°C: EIA RS-198, Method 104, Condition A <1kV C0G – 100 G or 1000 M – F, whichever is less. 500V test @ rated voltage, >500V test @ 500V X7R – 100 G or 1000 M – F, whichever is less. 500V test @ rated voltage, >500V test @ 500V Z5U – 10 G or 1000 M – F, whichever is less. Dielectric Withstanding Voltage: EIA RS-198, Method 103 250V test @ 250% of rated voltage for 5 seconds with current limited to 50mA. 500V test @ 150% of rated voltage for 5 seconds with current limited to 50mA. 1000V test @ 120% of rated voltage for 5 seconds with current limited to 50mA. ENVIRONMENTAL Vibration: with current limited to 50mA. ENVIRONMENTAL Vibration: EIA RS-198, Method 304, Condition D (10-2000Hz; 20g) Shock: EIA RS-198, Method 305, Condition I (100g) Life Test: EIA RS-198, Method 201, Condition D. <200V C0G – 200% of rated voltage @ +125°C X7R – 200% of rated voltage @ +125°C Z5U – 200% of rated voltage @ +85°C >500V C0G – rated voltage @ +125°C X7R – rated voltage @ +125°C Post Test Limits @ 25°C are: Capacitance Change: C0G ( 200V) – ±3% or 0.25pF, whichever is greater. C0G ( 500V) – ±3% or 0.50pF, whichever is greater. X7R – ± 20% of initial value (2) Z5U – ± 30% of initial value (2) Dissipation Factor: C0G – 0.10% maximum X7R – 2.5% maximum (3.5% for 25V) Z5U – 4.0% maximum Insulation Resistance: C0G – 10 G or 100 M – F, whichever is less. >1kV tested @ 500V. X7R – 10 G or 100 M – F, whichever is less. >1kV tested @ 500V. Z5U – 1 G or 100 M – F, whichever is less. Moisture Resistance: EIA RS-198, Method 204, Condition A (10 cycles without applied voltage). Post Test Limits @ 25°C are: Capacitance Change: C0G ( 200V) – ±3% or ±0.25pF, whichever is greater. C0G ( 500V) – ±3% or ± 0.50pF, whichever is greater. X7R – ± 20% of initial value (2) Z5U – ± 30% of initial value (2) Dissipation Factor: C0G – 0.10% maximum X7R – 2.5% maximum (3.5% for 25V) Z5U – 4.0% maximum Insulation Resistance: C0G – 10 G or 100 M – Fwhichever is less. 500V test @ rated voltage, >500V test @ 500V. X7R – 10 G or 100 M – F, whichever is less. 500V test @ rated voltage, >500V test @ 500V. Z5U – 1k M or 100 M – F, whichever is less. Thermal Shock: EIA RS-198, Method 202, Condition B (C0G & X7R: -55°C to 125°C); Condition A (Z5U: -55°C to 85°C) (1) +53 PPM -30 PPM/ °C from +25°C to -55°C, + 60 PPM below 10pF. (2) X7R and Z5U dielectrics exhibit aging characteristics; therefore, it is highly recommended that capacitors be deaged for 2 hours at 150°C and stabilized at room temperature for 48 hours before capacitance measurements are made. |
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