IP3047CX6

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© NXP B.V. 2010. All rights reserved.

Product data sheet

Rev. 2 — 23 November 2010

5 of 11

NXP Semiconductors

IP3047CX6

Integrated dual channel passive LC-filter network with ESD protection

7.

Application information

The setup for measuring insertion loss in a 50

Ω system is shown in Figure 3.

The insertion loss in a 50

Ω system for the two channels of the IP3047CX6 is shown in

Figure 4. The insertion loss is measured directly on the wafer with coplanar probes.

Unused pins are connected to ground with 50

Ω.

Fig 3.

Frequency response measurement configuration

OUT

001aai755

50

Ω

50

Ω

Vgen

DUT

IN

TEST BOARD

a. Channel 1 (pins A1 and A3).

b. Channel 2 (pins B1 and B3).

Fig 4.

Measured insertion loss magnitudes

001aam535

−30

−20

−40

−10

0

(dB)

−50

f (MHz)

10

001aam536

−30

−20

−40

−10

0

(dB)

−50

f (MHz)

10