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V62C5181024LL-70P Datasheet(PDF) 7 Page - Samsung semiconductor |
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V62C5181024LL-70P Datasheet(HTML) 7 Page - Samsung semiconductor |
7 / 43 page K4S643232C CMOS SDRAM REV. 1.1 Nov. '99 - 7 - AC OPERATING TEST CONDITIONS (VDD = 3.3V ± 0.3V, TA = 0 to 70°C) Parameter Value Unit AC input levels (Vih/Vil) 2.4/0.4 V Input timing measurement reference level 1.4 V Input rise and fall time tr/tf = 1/1 ns Output timing measurement reference level 1.4 V Output load condition See Fig. 2 3.3V 1200 Ω 870 Ω Output 50pF*1 VOH (DC) = 2.4V, IOH = -2mA VOL (DC) = 0.4V, IOL = 2mA Vtt = 1.4V 50 Ω Output 50pF*1 Z0 = 50 Ω (Fig. 2) AC output load circuit (Fig. 1) DC output load circuit 1. The DC/AC Test Output Load of K4S643232C-55/60/70 is 30pF. 2. The VDD condition of K4S643232C-55/60 is 3.135V~3.6V. Note : OPERATING AC PARAMETER 1. The minimum number of clock cycles is determined by dividing the minimum time required with clock cycle time and then rounding off to the next higher integer. Refer to the following ns-unit based AC table. Note : (AC operating conditions unless otherwise noted) Parameter Symbol Version Unit Note -55 -60 -70 -80 -10 CAS Latency CL 3 2 3 2 3 2 3 2 3 2 CLK CLK cycle time tCC(min) 5.5 - 6 - 7 - 8 10 10 12 ns Row active to row active delay tRRD(min) 2 CLK 1 RAS to CAS delay tRCD(min) 3 - 3 - 3 - 3 2 2 2 CLK 1 Row precharge time tRP(min) 3 - 3 - 3 - 3 2 2 2 CLK 1 Row active time tRAS(min) 7 - 7 - 7 - 6 5 5 4 CLK 1 tRAS(max) 100 us Row cycle time tRC(min) 10 - 10 - 10 - 9 7 7 6 CLK 1 Row cycle time in Auto refresh tRFC(min) 12 - 12 - 10 - 9 7 7 6 CLK 1,6 Last data in to row precharge tRDL(min) 2 CLK 2, 5 Last data in to new col.address delay tCDL(min) 1 CLK 2 Last data in to burst stop tBDL(min) 1 CLK 2 Col. address to col. address delay tCCD(min) 1 CLK Mode Register Set cycle time tMRS(min) 2 CLK Number of valid output data CAS Latency=3 2 ea 4 CAS Latency=2 1 |
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