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1070.0447 Datasheet(PDF) 4 Page - Schurter Inc. |
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1070.0447 Datasheet(HTML) 4 Page - Schurter Inc. |
4 / 5 page Changes that contribute to technical improvement are subject to alternations 2006 Datum Name Bearb. 18.08. Maurer TOUCHSCREEN Gepr. 18.08. Maurer 12,1“, 8-Wire Vert. AMT-98431-B1 EDV-Datasheet SPECIFICATIONS OF ANALOG RESISTIVE PET-ON-GLASS TOUCH SCREEN don’t change manually Manufactured by Apex Material Technology Corp. H 1070.0447 Zu Änd. Datum Name D 79346 Endingen page 4 of 5 Index: - 5. Environment Specification 5.1 Operating Temperature - 5 ° C - + 55° C Humidity less than 90% RH 5.2 Storage Temperature - 40 ° C - + 70° C at Ambient Humidity 6. Reliability Test 6.1 Exposure to high temperature Touch panel is put into a test machine at the condition of 70°C for 120 hours. Then it is left at the room tempera- ture for 24 hours or more. The measurement must satisfy the following: - Circuit close resistance: as Sec. 3.3 - Circuit open resistance: as Sec. 3.4 - Contact bounce: as Sec. 3.5 - Linearity test: as Sec. 3.6 6.2 Exposure to low temperature Touch panel is put into a test machine at the condition of –40°C for 120 hours. Then it is left at the room tempera- ture for 24 hours or more. The measurement must satisfy the following: - Circuit close resistance: as Sec. 3.3 - Circuit open resistance: as Sec. 3.4 - Contact bounce: as Sec. 3.5 - Linearity test: as Sec. 3.6 6.3 Exposure to constant temperature and humidity Touch panel is put into a test machine at the condition of 55°C, 95%RH for 120 hours. Then it is left at the room temperature for 24 hours or more. The measurement must satisfy the following: - Circuit close resistance: as Sec. 3.3 - Circuit open resistance: as Sec. 3.4 - Contact bounce: as Sec. 3.5 - Linearity test: as Sec. 3.6 6.4 Thermal Shock Touch panel is put into a test machine at the condition of –40°C for 30 minutes, and then 70°C for 30 minutes. The process is repeated by 10 cycles. Then it is left at the room temperature for 24 hours or more. The measurement must satisfy the following: - Circuit close resistance: as Sec. 3.3 - Circuit open resistance: as Sec. 3.4 - Contact bounce: as Sec. 3.5 - Linearity test: as Sec. 3.6 |
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