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LMZ10505 Datasheet(PDF) 1 Page - National Semiconductor (TI) |
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LMZ10505 Datasheet(HTML) 1 Page - National Semiconductor (TI) |
1 / 22 page LMZ10505 June 10, 2010 5A SIMPLE SWITCHER® Power Module with 5.5V Maximum Input Voltage Easy to Use 7 Pin Package 30107402 TO-PMOD 7 Pin Package 10.16 x 13.77 x 4.57 mm (0.4 x 0.39 x 0.18 in) θ JA = 20°C/W, θJC = 1.9°C/W (Note 3) RoHS Compliant Electrical Specifications ■ 25W maximum total output power ■ Up to 5A output current ■ Input voltage range 2.95V to 5.5V ■ Output voltage range 0.8V to 5V ■ ±1.63% feedback voltage accuracy over temperature ■ Efficiency up to 96% Key Features ■ Integrated shielded inductor ■ Flexible startup sequencing using external soft-start, tracking, and precision enable ■ Protection against in-rush currents and faults such as input UVLO and output short-circuit ■ -40°C to +125°C junction temperature operating range ■ Single exposed pad and standard pinout for easy mounting and manufacturing ■ Pin-to-pin compatible with LMZ10503 (3A/15W max) LMZ10504 (4A/20W max) ■ Fully enable for WEBENCH® and Power Designer Applications ■ Point-of-load conversions from 3.3V and 5V rails ■ Space constrained applications ■ Extreme temperatures/no air flow environments ■ Noise sensitive applications (i.e. transceiver, medical) Performance Benefits ■ Operates at high ambient temperatures ■ High efficiency up to 96% reduces system heat generation ■ Low radiated emissions (EMI) complies with EN55022 class B standard (Note 4) ■ Passes 10V/m radiated immunity EMI test standard EN61000 4-3 ■ Low output voltage ripple of 10 mV allows for powering noise-sensitive transceiver and signaling ICs ■ Fast transient response for powering FPGAs and ASICs System Performance Current Derating (V OUT = 3.3V) 30107413 Efficiency (V OUT = 3.3V) 30107471 Radiated Emissions (EN 55022, Class B) 30107412 Note 1: θ JA measured on a 2.25” x 2.25” (5.8 cm x 5.8 cm) four layer board. Refer to PCB Layout Diagrams or Evaluation Board Application Note: AN-2022. Note 2: EN 55022:2006, +A1:2007, FCC Part 15 Subpart B: 2007. See Figure 5 and layout for information on device under test. © 2010 National Semiconductor Corporation 301074 www.national.com |
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