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08053L104K4U4A Datasheet(PDF) 3 Page - AVX Corporation |
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08053L104K4U4A Datasheet(HTML) 3 Page - AVX Corporation |
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3 / 3 page  16 X8R/X8L Dielectric Specifications and Test Methods Parameter/Test X8R/X8L Specification Limits Measuring Conditions Operating Temperature Range -55ºC to +150ºC Temperature Cycle Chamber Capacitance Within specified tolerance Freq.: 1.0 kHz ± 10% Dissipation Factor ≤ 2.5% for ≥ 50V DC rating Voltage: 1.0Vrms ± .2V ≤ 3.5% for 25V DC and 16V DC rating Insulation Resistance 100,000MΩ or 1000MΩ - μF, Charge device with rated voltage for whichever is less 120 ± 5 secs @ room temp/humidity Charge device with 300% of rated voltage for Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current limited to 50 mA (max) Note: Charge device with 150% of rated voltage for 500V devices. Appearance No defects Deflection: 2mm Capacitance Test Time: 30 seconds Resistance to Variation ≤ ±12% Flexure Dissipation Meets Initial Values (As Above) Stresses Factor Insulation ≥ Initial Value x 0.3 Resistance Solderability ≥ 95% of each terminal should be covered Dip device in eutectic solder at 230 ± 5ºC with fresh solder for 5.0 ± 0.5 seconds Appearance No defects, <25% leaching of either end terminal Capacitance Variation ≤ ±7.5% Dip device in eutectic solder at 260ºC for 60 Dissipation Meets Initial Values (As Above) seconds. Store at room temperature for 24 ± 2 Resistance to Factor hours before measuring electrical properties. Solder Heat Insulation Meets Initial Values (As Above) Resistance Dielectric Meets Initial Values (As Above) Strength Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes Capacitance Variation ≤ ±7.5% Step 2: Room Temp ≤ 3 minutes Dissipation Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes Thermal Factor Shock Insulation Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes Resistance Dielectric Meets Initial Values (As Above) Repeat for 5 cycles and measure after Strength 24 ± 2 hours at room temperature Appearance No visual defects Capacitance Variation ≤ ±12.5% Dissipation ≤ Initial Value x 2.0 (See Above) Load Life Factor Insulation ≥ Initial Value x 0.3 (See Above) Resistance Dielectric Meets Initial Values (As Above) Strength Appearance No visual defects Capacitance Variation ≤ ±12.5% Load Dissipation ≤ Initial Value x 2.0 (See Above) Humidity Factor Insulation ≥ Initial Value x 0.3 (See Above) Resistance Dielectric Meets Initial Values (As Above) Strength Charge device with 1.5 rated voltage (≤ 10V) in test chamber set at 150ºC ± 2ºC for 1000 hours (+48, -0) Remove from test chamber and stabilize at room temperature for 24 ± 2 hours before measuring. Store in a test chamber set at 85ºC ± 2ºC/ 85% ± 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. Remove from chamber and stabilize at room temperature and humidity for 24 ± 2 hours before measuring. 1mm/sec 90 mm |
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