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REF5025AQDRQ1 Datasheet(PDF) 2 Page - Texas Instruments |
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REF5025AQDRQ1 Datasheet(HTML) 2 Page - Texas Instruments |
2 / 17 page ABSOLUTE MAXIMUM RATINGS (1) REF5020-Q1, REF5025-Q1, REF5030-Q1 REF5040-Q1, REF5045-Q1, REF5050-Q1 SBOS456B – SEPTEMBER 2008 – REVISED APRIL 2009 ............................................................................................................................................... www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE/ORDERING INFORMATION(1)(2) PRODUCT OUTPUT VOLTAGE PACKAGE-LEAD PACKAGE DESIGNATOR PACKAGE MARKING STANDARD GRADE (8 ppm, 0.1%) REF5020A 2.048 V SO-8 D RFQ5020 REF5025A 2.5 V SO-8 D RFQ5025 REF5030A 3.0 V SO-8 D PREVIEW REF5040A 4.096 V SO-8 D PREVIEW REF5045A 4.5 V SO-8 D RFQ5045 REF5050A 5.0 V SO-8 D PREVIEW HIGH GRADE (3 ppm, 0.05%) REF5020I 2.048 V SO-8 D RFQ5020 REF5025I 2.5 V SO-8 D PREVIEW REF5030I 3.0 V SO-8 D PREVIEW REF5040I 4.096 V SO-8 D PREVIEW REF5045I 4.5 V SO-8 D PREVIEW REF5050I 5.0 V SO-8 D PREVIEW (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. (2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging. PARAMETER REF50xx UNIT Input Voltage +18 V Output Short-Circuit 30 mA Operating Temperature Range –55 to +125 °C Storage Temperature Range –65 to +150 °C Junction Temperature (TJ max) +150 °C Human Body Model (HBM) 3000 V ESD Rating Charged Device Model (CDM) 1000 V (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. 2 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated |
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