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SN74LVC1G04 Datasheet(PDF) 1 Page - Texas Instruments |
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SN74LVC1G04 Datasheet(HTML) 1 Page - Texas Instruments |
1 / 19 page www.ti.com FEATURES 3 2 4 5 1 NC VCC Y A GND DBV PACKAGE (TOP VIEW) YZP PACKAGE (BOTTOM VIEW) DCK PACKAGE (TOP VIEW) 3 2 4 5 1 NC VCC Y A GND 3 2 4 5 1 NC Y A GND DNU GND VCC Y A DRL PACKAGE (TOP VIEW) See mechanical drawings for dimensions. 1 4 2 3 5 VCC DNU − Do not use YZV PACKAGE (BOTTOM VIEW) GND VCC Y A 3 1 2 4 GND NC Y VCC A NC 1 2 3 6 5 4 DRY PACKAGE (TOP VIEW) NC – No internal connection DESCRIPTION/ORDERING INFORMATION SN74LVC1G04 SINGLE INVERTER GATE SCES214U – APRIL 1999 – REVISED FEBRUARY 2007 • Available in the Texas Instruments • ±24-mA Output Drive at 3.3 V NanoFree™ Package • I off Supports Partial-Power-Down Mode • Supports 5-V V CC Operation Operation • Inputs Accept Voltages to 5.5 V • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • Max t pd of 3.3 ns at 3.3 V • ESD Protection Exceeds JESD 22 • Low Power Consumption, 10-µA Max I CC – 2000-V Human-Body Model (A114-A) – 200-V Machine Model (A115-A) – 1000-V Charged-Device Model (C101) This single inverter gate is designed for 1.65-V to 5.5-V VCC operation. The SN74LVC1G04 performs the Boolean function Y = A. NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package. This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. NanoFree is a trademark of Texas Instruments. PRODUCTION DATA information is current as of publication date. Copyright © 1999–2007, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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