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NX3L2G384_3 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 03 — 28 August 2009 13 of 20 NXP Semiconductors NX3L2G384 Dual low-ohmic single-pole single-throw analog switch Adjust fi voltage to obtain 0 dBm level at output. Increase fi frequency until dB meter reads −3dB. Fig 19. Test circuit for measuring the frequency response when channel is in ON-state dB 001aaj525 nY/nZ nE VIL fi RL nZ/nY VCC 0.5VCC Adjust fi voltage to obtain 0 dBm level at input. Fig 20. Test circuit for measuring isolation (OFF-state) dB 001aaj526 nY/nZ nE VIH fi RL nZ/nY VCC 0.5VCC RL 0.5VCC a. Test circuit b. input and output pulse definitions Fig 21. Test circuit for measuring crosstalk voltage between digital inputs and switch VVO 001aaj527 RL CL RL VI nY/nZ nZ/nY nE VCC 0.5VCC 0.5VCC G 001aaj528 on off off logic input (nE) VO Vct |
