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HAL103TQ-I Datasheet(PDF) 11 Page - Micronas |
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HAL103TQ-I Datasheet(HTML) 11 Page - Micronas |
11 / 12 page DATA SHEET HAL1xy Micronas April 8, 2009; DSH000150_001EN 11 3. Application Notes 3.1. Ambient Temperature Due to the internal power dissipation, the temperature on the silicon chip (junction temperature TJ) is higher than the temperature outside the package (ambient temperature TA). At static conditions and continuous operation, the fol- lowing equation applies: If IOUT > IDD, please contact Micronas application sup- port for detailed instructions on calculating ambient temperature. For typical values, use the typical parameters. For worst case calculation, use the max. parameters for IDD and Rth, and the max. value for VDD from the application. For all sensors, the junction temperature range TJ is specified. The maximum ambient temperature TAmax can be calculated as: 3.2. Extended Operating Conditions All sensors fulfill the electrical and magnetic character- istics when operated within the Recommended Oper- ating Conditions (see page 8). Supply Voltage Below 3.8 V Typically, the sensors operate with supply voltages above 3 V, however, below 3.8 V some characteristics may be outside the specification. Note: The functionality of the sensor below 3.8 V is not tested. For special test conditions, please contact Micronas. 3.3. Start-up Behavior Due to the active offset compensation, the sensors have an initialization time (enable time ten(O)) after applying the supply voltage. The parameter ten(O) is specified in Section 2.5.: Characteristics on page 9. During the initialization time, the output state is not defined and the output can toggle. After ten(O), the out- put will be low if the applied magnetic field B is above BON. The output will be high if B is below BOFF. For magnetic fields between BOFF and BON, the output state of the HAL sensor after applying VDD will be either low or high. In order to achieve a well-defined output state, the applied magnetic field must be above BONmax, respectively, below BOFFmin. 3.4. EMC and ESD For applications with disturbances on the supply line or radiated disturbances, a series resistor and a capacitor are recommended (see Fig. 3–1). The series resistor and the capacitor should be placed as closely as possible to the HAL sensor. Please contact Micronas for the detailed investigation reports with the EMC and ESD results. Fig. 3–1: Test circuit for EMC investigations T J T A T Δ + = T Δ I DD V DD × R th × = T Amax T Jmax T Δ – = RV 220 W VEMC VP 4.7 nF VDD OUT GND 1 2 3 RL 1.2 kW 20 pF |
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