ADS1259

SBAS424C – JUNE 2009 – REVISED MARCH 2010

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ORDERING INFORMATION

For the most current package and ordering information see the Package Option Addendum at the end of this

document, or see the TI web site at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range, unless otherwise noted.

ADS1259

MIN

MAX

UNIT

AVDD to AVSS

–0.3

+5.5

V

AVSS to DGND

–2.8

+0.3

V

DVDD to DGND

–0.3

+5.5

V

Input current, momentary

–100

+100

mA

Input current, continuous

–10

+10

mA

Analog input voltage to DGND

AVSS – 0.3

AVDD + 0.3

V

Digital input voltage to DGND

–0.3

DVDD + 0.3

V

Maximum junction temperature

+150

°C

Operating temperature range

–40

+125

°C

Storage temperature range

–60

+150

°C

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

2

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