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H55S2562JFR-75M Datasheet(PDF) 11 Page - Hynix Semiconductor

Part # H55S2562JFR-75M
Description  256MBit MOBILE SDR SDRAM based on 4M x 4Bank x16 I/O
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Manufacturer  HYNIX [Hynix Semiconductor]
Direct Link  http://www.skhynix.com/kor/main.do
Logo HYNIX - Hynix Semiconductor

H55S2562JFR-75M Datasheet(HTML) 11 Page - Hynix Semiconductor

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Rev 1.1 / July. 2009
11
11
256Mbit (16Mx16bit) Mobile SDR
H55S2562JFR Series
DC CHARACTERISTICS II (TA= -30 to 85oC)
Note:
1. IDD1 and IDD4 depend on output loading and cycle rates. Specified values are measured with the output open.
2. See the tables of next page for more specific IDD6 current values.
Parameter
Symbol
Test Condition
Speed
Unit Note
166MHz 133MHz 105MHz
Operating Current
IDD1
Burst length=1, One bank active
tRC ≥ tRC(min), IOL=0mA
50
40
40
mA
1
Precharge Standby Current
in Power Down Mode
IDD2P
CKE ≤ VIL(max), tCK = min
0.3
mA
IDD2PS
CKE ≤ VIL(max), tCK = ∞
0.3
mA
Precharge Standby Current
in Non Power Down Mode
IDD2N
CKE ≥ VIH(min), CS ≥ VIH(min),
tCK = min, Input signals are
changed one time during 2clks.
All other pins ≥ VDD-0.2V or ≤ 0.2V
5
mA
IDD2NS
CKE ≥ VIH(min), tCK = ∞
Input signals are stable.
1
Active Standby Current
in Power Down Mode
IDD3P
CKE ≤ VIL(max), tCK = min
3
mA
IDD3PS
CKE ≤ VIL(max), tCK = ∞
3
Active Standby Current
in Non Power Down Mode
IDD3N
CKE ≥ VIH(min), CS ≥ VIH(min),
tCK = min, Input signals are
changed one time during 2clks.
All other pins ≥ VDD-0.2V or ≤ 0.2V
10
mA
IDD3NS
CKE ≥ VIH(min), tCK = ∞
Input signals are stable.
5
Burst Mode Operating
Current
IDD4
tCK ≥ tCK(min), IOL=0mA
All banks active
55
45
45
mA
1
Auto Refresh Current
IDD5
tRFC ≥ tRFC(min),
70
mA
Self Refresh Current
IDD6
CKE ≤ 0.2V
See Next Page
mA
2
Standby Current in
Deep Power Down Mode
IDD7
See p.50~51
10
uA
3


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