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38 page 
MPC5607B Microcontroller Data Sheet, Rev. 3 Preliminary—Subject to Change Without Notice Electrical characteristics Freescale Semiconductor 38 ECC circuitry provides correction of single bit faults and is used to improve further automotive reliability results. Some units will experience single bit corrections throughout the life of the product with no impact to product reliability. 3.10.2 Flash power supply DC characteristics Table 25 shows the power supply DC characteristics on external supply. Table 23. Flash module life Symbol C Parameter Conditions Value Unit Min Typ P/E CC C Number of program/erase cycles per block for 16 Kbyte blocks over the operating temperature range (TJ) — 100,000 — cycles P/E CC C Number of program/erase cycles per block for 32 Kbyte blocks over the operating temperature range (TJ) — 10,000 100,0001 1 To be confirmed cycles P/E CC C Number of program/erase cycles per block for 128 Kbyte blocks over the operating temperature range (TJ) — 1,000 100,0001 cycles Retention CC C Minimum data retention at 85 °C average ambient temperature2 2 Ambient temperature averaged over duration of application, not to exceed recommended product operating temperature range. Blocks with 0–1,000 P/E cycles 20 — years Blocks with 10,000 P/E cycles 10 — years Blocks with 100,000 P/E cycles 5— years Table 24. Flash read access timing Symbol C Parameter Conditions1 1 V DD = 3.3 V ± 10% / 5.0 V ± 10%, TA = −40 to 125 °C, unless otherwise specified Max Unit fREAD CC P Maximum frequency for Flash reading 2 wait states 64 MHz C 1 wait state 40 C 0 wait states 20 |
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