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41 page 
Electrical characteristics MPC5607B Microcontroller Data Sheet, Rev. 3 Preliminary—Subject to Change Without Notice Freescale Semiconductor 41 — Unexpected reset — Critical data corruption (control registers...) • Prequalification trials − Most of the common failures (unexpected reset and program counter corruption) can be reproduced by manually forcing a low state on the reset pin or the oscillator pins for 1 second. To complete these trials, ESD stress can be applied directly on the device. When unexpected behavior is detected, the software can be hardened to prevent unrecoverable errors occurring. 3.11.2 Electromagnetic interference (EMI) The product is monitored in terms of emission based on a typical application. This emission test conforms to the IEC61967-1 standard, which specifies the general conditions for EMI measurements. 3.11.3 Absolute maximum ratings (electrical sensitivity) Based on two different tests (ESD and LU) using specific measurement methods, the product is stressed in order to determine its performance in terms of electrical sensitivity. Table 27. EMI radiated emission measurement1,2 1 EMI testing and I/O port waveforms per IEC 61967-1, -2, -4 2 For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your local marketing representative. Symbol C Paramete r Conditions Value Unit Min Typ Max — SR — Scan range — 0.150 1000 MHz fCPU SR — Operating frequency —— 64 — MHz VDD_LV SR — LV operating voltages — — 1.28 — V SEMI CC T Peak level VDD = 5V, TA =25° C, LQFP144 package Test conformin g to IEC 61967-2, fOSC = 8 MHz/fCPU = 64 MHz No PLL frequency modulatio n — — 18 dBµV ± 2% PLL frequency modulatio n —— 143 3 All values need to be confirmed during device validation dBµV |
