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BLF645 Datasheet(PDF) 4 Page - NXP Semiconductors |
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BLF645 Datasheet(HTML) 4 Page - NXP Semiconductors |
4 / 13 page BLF645_1 © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 01 — 27 January 2010 4 of 13 NXP Semiconductors BLF645 Broadband power LDMOS transistor 8. Test information 8.1 RF performance The following figures are measured in a class-AB production test circuit. 8.1.1 1-Tone CW VDS = 32 V; IDq = 900 mA (for total device); f = 1300 MHz. VDS = 32 V; f = 1300 MHz. (1) IDq = 200 mA (for total device). (2) IDq = 400 mA (for total device). (3) IDq = 600 mA (for total device). (4) IDq = 900 mA (for total device). (5) IDq = 1200 mA (for total device). (6) IDq = 1400 mA (for total device). (7) IDq = 1800 mA (for total device). Fig 1. Power gain and drain efficiency as function of load power; typical values Fig 2. Power gain as a function of load power; typical values PL (W) 0 160 120 40 80 001aal361 17 18 16 15 14 19 20 Gp (dB) 13 40 50 30 20 10 60 70 ηD (%) 0 ηD Gp PL (W) 0 160 120 40 80 001aal362 Gp (dB) 16 14 18 20 12 17 15 19 13 (7) (6) (5) (4) (3) (2) (1) |
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