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ISO7420MD Datasheet(PDF) 11 Page - Texas Instruments |
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ISO7420MD Datasheet(HTML) 11 Page - Texas Instruments |
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11 / 19 page  TC − Case Temperature − °C 0 20 40 60 80 100 120 140 160 180 200 0 50 100 150 200 VCC1, VCC2 at 3.6 V G002 VCC1, VCC2 at 5.5 V S0417-01 1 2 3 4 8 7 6 5 V CC1 0.1 F m 2 mm max. from V CC1 OUTA INB OUTPUT INPUT GND1 ISO7421 V CC2 0.1 F m 2 mm max. from V CC2 INA OUTB OUTPUT INPUT GND2 ISO7420, ISO7420M ISO7421, ISO7421M www.ti.com SLLS984A – JUNE 2009 – REVISED DECEMBER 2009 (over recommended operating conditions unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT θJB Junction-to-board thermal resistance 37 °C/W θJC Junction-to-case thermal resistance 69.1 °C/W VCC1 = VCC2 = 5.5 V, TJ = 150°C, CL = 15 pF, PD Device power dissipation 390 mW Input a 150-Mbps 50% duty-cycle square wave Figure 5. θJC Thermal Derating Curve per IEC 60747-5-2 ICC EQUATIONS ICC1,2 = ICC1,2_quiescent + Sum of all dynamic ICC inputs on side 1,2 + sum of all dynamic ICC outputs on side 1,2 (1) ICC_quiescent can be determined from the electrical specification tables for concerned product included in the datasheet for the appropriate VCC. Dynamic ICC can be calculated as follows. At VCC = 3.6, worst case ICC_input = 0.016 × f (2) ICC_output = 0.02 × f + 0.002 × f × (CL – 0.5) (3) At VCC = 5.5, worst case ICC_input = 0.036 × f (4) ICC_output = 0.033 × f + 0.0032 × f × (CL – 0.5) (5) where ICC is in mA, f = data rate in Mbps, CL = capacitive load in pF. Figure 6. Typical ISO7421 Application Circuit Copyright © 2009, Texas Instruments Incorporated Submit Documentation Feedback 11 Product Folder Link(s): ISO7420, ISO7420M ISO7421, ISO7421M |
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